Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Contact and non-contact type dual-purpose surface roughness measuring systems

A surface roughness and contact measurement technology, applied in the direction of electrical/magnetic roughness/irregularity measurement, measuring device, electromagnetic measuring device, etc., to achieve the effect of expanding the range, accurate and reasonable measurement data, and convenient correction

Inactive Publication Date: 2008-03-12
北京恒安通达科技有限公司
View PDF0 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Another object of the present invention is to provide a contact and non-contact dual-purpose surface roughness measurement system that can be used to measure small traces of warheads or tools. Complementary correction analysis solves many defects and deficiencies in existing contact measuring instruments and non-contact measuring instruments

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Contact and non-contact type dual-purpose surface roughness measuring systems

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0026] Embodiment 1 As shown in Figure 1, the contact and non-contact dual-purpose surface roughness measurement system mainly consists of a one-dimensional workbench, a column, an optical needle type non-contact measuring head 2, a diamond stylus type measuring head 3, a drive circuit, and a measurement And data acquisition circuit, computer composition. A one-dimensional workbench driven by a stepping motor is fixedly arranged on a fixed base, a fixing device for an object to be measured is arranged on the one-dimensional workbench, and a computer is connected to control the stepping motor through a drive circuit. A column 1 is fixedly arranged on the base next to the one-dimensional workbench, and the column 1 is respectively equipped with a light needle type non-contact measuring head 2 and a diamond stylus type measuring head 3 . Both the optical needle type non-contact measuring head 2 and the diamond stylus type measuring head 3 are set slidingly on the column, and the ...

Embodiment 2

[0027] Embodiment 2 The workbench of the contact and non-contact dual-purpose surface roughness measurement system is fixedly arranged on a base, and another fixed column is installed on the base, and a measuring microscope and a phase grating interferometric PGI contact sensor are movable on the column 4. The worktable is a two-dimensional moving X / Y workbench, and the X / Y workbench is driven by an AC servo motor, and the computer is connected to the AC servo motor that drives the X / Y workbench through the drive circuit 2; A rotating and clamping device for fixing warheads or tools is arranged on the workbench. The rotating and clamping device is connected to and driven by the AC servo motor of the device. The AC servo motor is connected to the computer through the drive circuit 1 . The inductance signal lines of the measuring microscope and the phase grating interferometric PGI contact sensor 4 are connected to the same measurement and data acquisition circuit, and are connec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a contact and non-contact type dual-purpose surface roughness measuring system which comprises a measuring sensor a computer and is characterized in that the computer is connected and provided with two groups of measuring sensors through measurement and data acquisition circuit, and the two groups of measuring sensors are respectively a non-contact type measuring head and a contact type measuring head. The contact and non-contact type dual-purpose surface roughness measuring system can realize the contact and non-contact type engineering surface roughness measuring method through a measuring instrument, centralize the advantages of contact type and non-contact type, enlarge the range of measuring objects, reduce the cost, provide the precise and reasonable measuring data, implement the real-time contrast and deviation correction for the two measuring results, and be applied to the two-dimensional or three-dimensional mark measurement of engineering roughness of various complex workpiece surfaces to be measured.

Description

technical field [0001] The invention belongs to the field of engineering surface measurement technology and its equipment, and in particular relates to a contact and non-contact measuring method which is used for the measurement of tiny traces of workpieces such as various engineering surfaces and warheads or tools, and has two measurement methods: contact and non-contact. Dual purpose surface roughness measurement system. Background technique [0002] The measurement of traces generally adopts the method of digital photography to obtain the enlarged two-dimensional plane image of the traces of the object to be tested. Since the tiny traces are three-dimensional, they are usually left by mechanical scratches between the relevant parts and the surface of the object to be measured. It is concave and three-dimensional, and its shape and subtle features are distributed in three dimensions, so two-dimensional plane images cannot give a complete description of the traces. For exa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B21/30G01B21/20G01B11/30G01B11/24G01B7/34G01B7/28
Inventor 孙正贵李斌
Owner 北京恒安通达科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com