Testing interface with exterior diagnose used for concurrent computer system and testing method thereof

Abstract

The invention discloses an out-band diagnostic test interface and a test method for parallel computer systems, which comprises an external connecting port unit and an internal diagnostic test logic unit; wherein, the external connecting port unit comprises a plurality of boundary scan test access ports TAP and a plurality of RS232 serial interfaces connected with a microprocessor; and the internal diagnostic test logic unit comprises a diagnostic test instruction register, a diagnostic test data register, a host instruction register, a host data register, a system internal error and state register, a TAP controller, a diagnostic test logic controller, a serial port controller and an interrupt control logic unit. The out-band diagnostic test interface and a test method for parallel computer systems of the invention has the advantages of simple structure, easy operation and high reliability and stability.

Description

technical field [0001] The invention mainly relates to the technical field of diagnostic testing of parallel computer systems, in particular to an out-of-band diagnostic testing interface and testing method for parallel computer systems. Background technique [0002] A parallel computer system usually consists of multiple nodes. Each node has its own microprocessor, node controller, local memory, interconnection communication interface, input and output devices, etc., forming a relatively independent system. All nodes are interconnected through the interconnection communication interface to form a high-performance parallel computer system. With the development of VLSI technology and the improvement of printed circuit board manufacturing technology, the performance of parallel computer systems is increasing day by day, and the scale and complexity of software and hardware are also increasing day by day. The problem of fault diagnosis and testing has attracted more and more a...

AI Technical Summary

Problems solved by technology

[0004] However, the diagnostic testing methods adopted by the industry for computer systems can only detect some explicit static faults of the system, and lack effective detection methods for dynamic implicit faults and some explicit static faults that occur during system operation. To obtain real-time operating status information inside the system without affecting the normal operation of the system, it is impossible to perform out-of-band diagnostic tests on the system

Especially in today's large-scale parallel computer systems, there are many types and large quantities of motherboards contained in the system, which have high requirements for system reliability, availability and maintainability, and the diagnostic and testing tasks are heavy. At present, there is no effective method to realize parallelism Parallel out-of-band diagnostic testing of multiple nodes in a computer system

Images