Method for locating parameter type fault of analogue integrated circuit

A technology of integrated circuits and positioning methods, which is applied in analog circuit testing, electronic circuit testing, etc., and can solve the problems of low efficiency of multi-parameter fault location, difficult diagnosis and automation, etc.
CN101201386AInactive Publication Date: 2008-06-18UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
UNIV OF ELECTRONICS SCI & TECH OF CHINA
Publication Date
2008-06-18
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a location method of the parameter type fault of the analog integrated circuit. The invention carries out the polyphase filter bank for the measured analog integrated circuit, then calculates the cohere function sequence which corresponds to the faultless sub band sequence for the fault polyphase filter bank sequence in the sub band of the highest fault resolution, and obtains the autocorrelation function sequence of the cohere function sequence, and takes the definite integral answers of the autocorrelation function sequence of the cohere function as the digital characteristic of the fault to realize the fault location. By comparing to the exist technology, the invention can realize the location of the parameter type fault of the analog integrated circuit, reach high accuracy of fault diagnosis, high fault resolution and high fault coverage, realize the multi-parameter type fault location, and easily realize the automation of the fault diagnosis by the digitized fault characteristic with the obvious difference.
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Description

technical field

[0001] The invention belongs to the field of fault diagnosis of integrated circuits, in particular to a method for locating parametric faults of simulated integrated circuits. Background technique

[0002] Analog integrated circuits can cause component parameters to deviate (drift) from their nominal values ​​due to various reasons. The parameter deviation can cause circuit performance degradation. If the parameter deviation exceeds the tolerance range, it will become a parametric fault of the analog integrated circuit. At this time, the circuit’s Although the topology has not changed, it will cause severe degradation or even failure of the circuit performance.

[0003] At present, domestic and foreign researches on parametric fault diagnosis of analog integrated circuits are very active. Typical fault diagnosis methods include parametric fault detection methods based on circuit transfer function coefficients and test methods based on subband filtering. The...

Claims

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