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Electromagnetic interference scanning device and method

An electromagnetic interference and interference source technology, which is applied to measurement devices, electromagnetic field characteristics, and measurement electricity, etc., can solve problems such as low accuracy and complicated interference source positioning, and achieve the effect of improving positioning efficiency.

Inactive Publication Date: 2010-06-23
ZTE CORP
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0008] In view of the above analysis, the present invention aims to provide an electromagnetic interference scanning device and method to solve the problems of complicated interference source location and low accuracy in the prior art

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  • Electromagnetic interference scanning device and method
  • Electromagnetic interference scanning device and method

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Embodiment Construction

[0054] Preferred embodiments of the present invention will be specifically described below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and are used together with the embodiments of the present invention to explain the principles of the present invention.

[0055] first combined with figure 2 The device described in the embodiment of the present invention is described in detail.

[0056] Such as figure 2 as shown, figure 2 It is a schematic structural diagram of the electromagnetic interference scanning device according to the embodiment of the present invention, which may specifically include: a near-field scanning unit (including one or more of a near-field scanning sensor, a voltage probe and a current probe), an electromagnetic interference far-field antenna, a spectrum Analysis unit, calculation control unit, radio frequency selection unit and interface unit, the functions of each unit will be d...

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Abstract

The invention discloses an electromagnetic interference scanning device and method thereof. The method comprises the following steps: obtaining a near-field scanning result and a far-field measuring result of a measured object through the automatic switchover between the near-field electromagnetic interference intensity scanning and the far-field electromagnetic interference intensity measuring; and positioning the interference source with the maximal contribution to an overproof frequency point according to the near-field scanning result, the far-field measuring result and a pre-stored standard measuring result. The invention improves the positioning efficiency of electromagnetic interference source by the automatic rapid switchover between the near-field electromagnetic interference intensity scanning and the far-field electromagnetic interference intensity measuring.

Description

technical field [0001] The invention relates to the field of electronic product testing, in particular to an electromagnetic interference scanning device and method. Background technique [0002] EMC (Electromagnetic Compatibility, Electro-Magnetic Compatibility) refers to the ability of electronic equipment and systems to work harmoniously and effectively in various electromagnetic environments. The purpose of electromagnetic compatibility design is to enable electronic equipment to suppress various external interferences, enable electronic equipment to work normally in a specific electromagnetic environment, and at the same time reduce the electromagnetic interference of electronic equipment itself to other electronic equipment. [0003] EMC radiation emission test is one of the test items of EMC test. In this test item, if it is impossible to locate the main electromagnetic interference source that causes the radiation emission to exceed the standard, no matter how much e...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R29/08
Inventor 马光明严勇
Owner ZTE CORP
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