Method for recognition of failure diagnosis parameter of real time electric circuit

Abstract

The invention discloses a fault diagnosis parameter recognition method of a realtime electronic circuit, comprising the following steps: all element parameter increment of a to-be-tested electronic circuit is substituted by an equivalent power supply; a circuit is excited repeatedly by a current source at a testable node to obtain an impedance matrix Zm of testable node voltage and testable node current excited by the testable node voltage and the mixed matrix H of the testable node voltage and the equivalent power supply; the testable node voltages of a to-be-tested circuit and a normal nominal circuit are measured and the difference value of the voltages is calculated, thereby establishing a circuit testing and diagnosis characteristic equation; the element parameter increment and node voltage increment are taken as optimizing variable to establish a parameter recognition equation through making use of the optimization theory and combining with the testing and diagnosis characteristic equation; moreover, the parameter recognition equation is solved through making use of a neural network and a transconductance neural network based on the augmented lagrangian multiplier method; finally, fault recognition is completed according to the output of the neural networks. The fault diagnosis parameter recognition method which has the advantages of realtime character and high locating accuracy is suitable to be used under quick diagnosis condition in modern industry.

Description

technical field [0001] The invention relates to a fault diagnosis method of an electronic circuit, in particular to a real-time fault diagnosis parameter identification method of an electronic circuit. Background technique [0002] The parameter identification method is an important method for fault diagnosis of analog electronic circuits. Generally, component parameters are obtained by solving circuit equations. Due to the large scale of circuits, especially analog-digital hybrid integrated circuits and very large-scale analog integrated circuits, it is possible to test node Therefore, it is very difficult to obtain circuit equations that can find all parameters, and such equations are generally large-scale nonlinear equations, which are often time-consuming to solve and the obtained solutions may not be consistent with the actual situation. Contents of the invention [0003] In order to solve the above-mentioned technical problems existing in the existing electronic circ...

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Problems solved by technology

[0002] The parameter identification method is an important method for fault diagnosis of analog electronic circuits. Generally, component parameters are obtained by solving circuit equations. Due to the large scale of circuits, especially analog-digital hybrid integrated circuits and very large-scale analog i

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