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Method for testing digital oscilloscope waveform capturing rate

A digital oscilloscope, waveform capture rate technology, applied in the direction of digital variable display, instruments, measuring electricity, etc., can solve problems such as omission

Inactive Publication Date: 2008-10-08
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the glitch falls within the dead time between samples, it will be missed during the acquisition

Method used

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  • Method for testing digital oscilloscope waveform capturing rate
  • Method for testing digital oscilloscope waveform capturing rate
  • Method for testing digital oscilloscope waveform capturing rate

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Embodiment Construction

[0022] The following describes preferred specific embodiments of the present invention in conjunction with the accompanying drawings. It is to be noted that similar components are given similar reference numerals even though they appear in different drawings. In the following description, when a detailed description of known functions and designs employed may obscure the subject matter of the present invention, these descriptions will be omitted here.

[0023] figure 1 It is a schematic diagram of digital oscilloscope waveform acquisition and processing. In the figure, the digital oscilloscope first collects the waveform, and the collection time is T 1 . The digital oscilloscope then performs signal processing on the collected waveform data. During this period, the digital oscilloscope cannot capture the signal, and the dead time is T 2 .

[0024] figure 2 It is a principle diagram of a specific embodiment of the testing method of the waveform capture rate of the presen...

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Abstract

The invention discloses a test method of digital oscilloscope waveform capture rate, including: 1, inputting a double pulse signal to a digital oscilloscope, wherein, the waveforms of the two pulses are different, and the trigger time interval between them can be continuously adjustable, the time interval between the two pulses can display the two pulses simultaneously; 2, continuously regulating(shortening or increasing) the time interval between the two pulses until the second pulse of the two pulses just clears away or appears, at this point, the inverse number of the time interval between the two pulses is the maximum waveform number that can be captured by the digital oscilloscope, namely the waveform capture rate. The invention adopts the periodic double pulse signal, and continuously regulates (shortens or increases) the time interval between the two pulses of the double pulse signal until the second pulse of the two pulses just clears away or appears, thereby the waveform capture rate (namely the inverse number of the time interval between the two pulses at the critical point) can be obtained, and the waveform capture rate of the digital oscilloscope can be commendably tested or verified.

Description

technical field [0001] The invention relates to a method for testing relevant technical indicators of a digital oscilloscope, in particular to a method for testing the waveform capture rate of a digital oscilloscope. Background technique [0002] The so-called "waveform capture rate" refers to the number of waveforms captured and displayed by the digital oscilloscope per unit time. [0003] The analog oscilloscope is a real-time, intuitive oscilloscope, and its waveform capture rate is the highest, which is unmatched by the digital oscilloscope. But the analog oscilloscope has a big defect, that is, the obtained waveform cannot be stored, which makes it very difficult to analyze the waveform. Moreover, the bandwidth of the analog oscilloscope is very limited, and the waveform information before the trigger is blank. These deficiencies are why analog oscilloscopes have lost their mainstream status. [0004] The digital storage oscilloscope solves the shortage of analog osc...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R35/00G01R13/02
Inventor 田书林叶芃王厚军毛怡滕志超
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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