Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Piezoresistor test method

A technology of piezoresistor and testing method, which is applied in the direction of measuring resistance/reactance/impedance, measuring electricity, measuring devices, etc., can solve problems such as the inability to test the resistance value of piezoresistors, achieve complete electrical performance inspection, improve accuracy and The effect of stability

Inactive Publication Date: 2012-08-01
靖江睿能信息科技有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the embodiments of the present invention is to provide a method for testing varistors, which aims to solve the problem that the resistance value of varistors cannot be tested, so that the products equipped with varistors cannot be tested for complete electrical performance.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Piezoresistor test method
  • Piezoresistor test method
  • Piezoresistor test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0016] In the embodiment of the present invention, a high-frequency alternating current lower than the rated voltage of the varistor is applied to both ends of the varistor to be tested, and an isolation circuit is connected to the high point end of the bypass element connected to the varistor to be tested , by calculating the capacitance value of the tested piezoresistor to judge whether the tested piezoresistor is a good product.

[0017] Ordinary resistors obey Ohm's law, while the voltage and current of varistors have a special nonlinear relationship. When the voltage loaded on both ends of th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention is applicable to the circuit testing field and provides a testing method for voltage dependent resistor. The method comprises the following steps: high frequency alternating current is loaded at both side of the voltage dependent resistor. Voltage of the alternating current is lower than the nominal voltage of the voltage dependent resistor; The buffer circuit of shunt elements is connected with the high point terminal of the shunt elements connected with the measured voltage dependent resistor; A capacitance value of the measured voltage dependent resistor is calculated and compared to the set threshold value range so as to judge whether the measured voltage dependent resistor is acceptable or not. Accuracy and stability in detection of electrical property of voltage dependent resistor can be greatly improved through the invention. Various defective electric properties of the voltage dependent resistor loaded on FPC can be effectively detected so as to realize complete inspection of electric properties.

Description

technical field [0001] The invention belongs to the field of circuit testing, in particular to a testing method for piezoresistors. Background technique [0002] Static electricity will cause great harm to the electronics manufacturing industry, and the same is true for the flexible printed circuit board (Flexible Printed Circuit board, FPC) manufacturing industry. The accumulated static electricity will attract fine dust and affect the insulation performance and appearance between lines. Moreover, static electricity will cause potential damage and slow failure to important electronic components such as chips on the circuit board, causing continuous harm. What's more serious is that the instantaneous discharge of accumulated static electricity often causes the line medium to break down, the core wire is blown, the leakage current of the electronic components mounted on the circuit board increases, the aging of the components is accelerated, and the electrical performance pa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R27/02G01R27/26
Inventor 华江刘凯
Owner 靖江睿能信息科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com