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Test data conversion method of integrate circuit-oriented test

A technology for testing data and converting methods, which is applied in electronic circuit testing, electrical digital data processing, special data processing applications, etc.

Inactive Publication Date: 2009-02-11
BEIJING CHIPADVANCED
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Some companies have written some simple scripts to complete some simple functions according to their actual situation, which is not only poor in versatility, but also difficult to transplant and expand
This defect has not been effectively resolved in the latest J750Ex test machine

Method used

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  • Test data conversion method of integrate circuit-oriented test
  • Test data conversion method of integrate circuit-oriented test
  • Test data conversion method of integrate circuit-oriented test

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0047] Data in the DATA file:

[0048] Coordinate: X-35Y34_X-34Y34_X-33Y34_X-32Y34_X-31Y34_X-30Y34_X-29Y34_X-28Y34

[0049] ID String: 061114_0001977_01_Coordinate

[0050] Corresponding to the data in the BHTC file:

[0051] X|Y|Site|ID Strings

[0052] —35|34|0|061114000197701-035+034

example 2

[0054] Data in the DATA file:

[0055] Site Bin

[0056] 0 1

[0057] Corresponding to the data in the BHTC file:

[0058] Bin|X|Y|Site|

[0059] 1|—35|34|0|

example 3

[0061] Data in the DATA file:

[0062] Number Site Test Name Pin Channel Measured

[0063] 0 0 cont_gnd mrst 136 -500.6259mV

[0064] 1 0 cont_gnd mclk 9 -499.8950mV

[0065] 16 0 cont_vdd IO1 2 656.2770mV

[0066] 17 0 cont_vdd IO2 17 655.5902mV

[0067] 18 0 Idd_rst0 VDD 2 153.8121uA

[0068] Number Site Result Test Name

[0069] 19 0 PASS Sort1

[0070] 20 0 PASS CPTEST_0

[0071] Corresponding to the data in the BHTC file:

[0072] Site|test0|test1|test16|test17|test18|test19|test20|

[0073] 0|-500.6259|-499.8950|656.2770|655.5902|153.8121|PASS|PASS|

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PUM

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Abstract

The invention discloses a method for converting integrated circuit test oriented test data, which aims at J750 series testing machines and comprises the following steps: (1) storing the raw data files output by the testing machines according to the pre-determined path, and generating a filename of a created data file according to the pre-determined format; (2) filling the related items in the created data file according to the contents in the raw data files; and (3) under the condition that a plurality of chips are tested in parallel, firstly, filling the pre-determined data items at the column heading part of the created data files, and then starting to scan data acquired from different testing items at a coordinate from the raw data on a multi-thread basis, and, finally, filling the data under the corresponding testing names respectively. The method can process the data generated during the testing process of batch processing and realize the full automation without manual intervention.

Description

technical field [0001] The invention relates to a method capable of realizing batch conversion of integrated circuit test data, in particular to a method for automatically and real-time batch conversion of ASCII code J750 test data into other data formats for the actual needs of large-scale integrated circuit testing, The invention belongs to the technical field of integrated circuit testing. Background technique [0002] In the manufacturing process of integrated circuits, testing is a necessary but time-consuming and expensive process. It is one of the key means to ensure the performance and quality of integrated circuits. Over the past 40 years, with the development of integrated circuits to the fourth generation, integrated circuit testing machines have also developed from initially testing small-scale integrated circuits to testing medium-scale, large-scale and ultra-large-scale integrated circuits. In the 1980s, ultra-large-scale integrated circuit testing machines in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30G01R31/28
Inventor 刘炜郑忠林吉国凡张琳王慧金兰孙博石志刚赵智昊陈希孙杨
Owner BEIJING CHIPADVANCED
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