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Multi-stage data processor having signal repeater

A signal processing and signal technology, applied in the field of multi-level data processors with signal repeaters, to achieve the effect of reducing cost and size, test time and complexity

Active Publication Date: 2012-05-30
ADVANTEST CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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  • Multi-stage data processor having signal repeater
  • Multi-stage data processor having signal repeater
  • Multi-stage data processor having signal repeater

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Experimental program
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Embodiment Construction

[0058] The following will refer to figure 1 A test device 100 according to an exemplary embodiment of the present invention is explained.

[0059] The testing device 100 mainly includes two parts, namely a central control unit 101 and a data processing device 102 .

[0060] The central control unit 101 includes an input signal generator 103 for generating N+M input signals (ie N drive signals and M comparison signals) related to the test performed by the test device 100 . These input signals are supplied to the signal processing device 102 via the input signal supply line 104 .

[0061] The signal processing device 102 is used to process the generated input signal transmitted via the input signal supply line 104 and generate an output signal which can be provided to the post-processing unit 105 of the central control unit 101 .

[0062] The signal processing device 102 is formed of P stages, where P may be sixty-four. First Level 106 in figure 1 is shown in detail. Other ...

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Abstract

A signal processing device (102) comprising a plurality of processing stages (106 to 108), each of the plurality of processing stages (106 to 108) being adapted for applying an input signal to each of at least one item under examination (109) to be coupled to a respective one of the plurality of processing stages (106 to 108), and at least one signal reconditioning unit (116), at least one signalreconditioning unit (116) being adapted for reconditioning the input signal in a signal path between a preceding one of the plurality of processing stages (106) and a subsequent one of the plurality of processing stages (107).

Description

Background technique [0001] WO99 / 23499A discloses a modular integrated circuit tester comprising a plurality of tester modules for performing a series of tests on an integrated circuit device under test. A pattern generator is connected to each detector channel. [0002] For testing electronic devices, in particular integrated electronic circuits providing digital electrical output signals, test or stimulus signals are supplied to the inputs of the device under test and the response signal of the device under test is evaluated by automatic test equipment, e.g. Compare. Such automatic test equipment already includes specific test functions, that is to say test functions or routines that the test equipment can execute. Such testing functionality may be incorporated into the testing equipment in the form of executable software code. [0003] Such a test device can be used as a multi-stage data processor comprising a plurality of test stages daisy-chained to a central control u...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3183
CPCG01R31/31924G01R31/31922
Inventor 于尔根·赛瑞尔
Owner ADVANTEST CORP