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Multifunctional test device based on SCM system

A multi-functional testing and single-chip technology, applied in measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of long time and low test efficiency, and achieve improved work efficiency, improved test efficiency and accuracy, and improved test speed. Effect

Inactive Publication Date: 2010-12-29
惠州德赛信息科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the prior art, the Blu-ray is tested on the Blu-ray DVD player, and the test is performed after the Blu-ray DVD player is started. The test time is about 1.5 minutes per unit, which is longer and the test efficiency is lower.

Method used

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  • Multifunctional test device based on SCM system
  • Multifunctional test device based on SCM system
  • Multifunctional test device based on SCM system

Examples

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Embodiment Construction

[0016] The present invention will be further described below in conjunction with drawings and embodiments.

[0017] Such as figure 1 The multi-function test device based on the single-chip microcomputer system shown includes a switching power supply, a test control board and a front-end control panel. The test control board includes a crystal oscillator and a single-chip microprocessor (MCU), and the crystal oscillator is connected with the single-chip microprocessor. The model of the single-chip microprocessor is STC89C52. The front-end control panel includes a vacuum fluorescent display (VFD screen) and an interface, and the interface between the single-chip microprocessor and the front-end control panel is connected through a high-speed synchronous serial port control bus (SPI control bus) and a power line. The switching power supply is connected with the test control board.

[0018] Instructions for use of this multi-function test device based on single-chip microcomput...

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PUM

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Abstract

The invention discloses a multifunctional testing device based on a monolithic system, comprising a switch power supply, a testing control board and a front end control panel. The switch power supply is connected with the testing control board, which is connected with the front end control panel through a power line and a control wire. Applied to production line testing, the testing device considerably improves the testing efficiency and accuracy of keypads / display plates / audio plates and other parts. The monolithic system constructed with STC89C52 can rapidly test the reliability and consistence of parts, for example, whether the defects of no display, less display, omitted display, more display and the like exist in the display plate. The testing device consumedly improves the testing speed and the working efficiency, with the testing time being 10 seconds per piece.

Description

technical field [0001] The invention relates to a testing device, in particular to a multifunctional testing device based on a single-chip microcomputer system. Background technique [0002] In the prior art, the Blu-ray is tested on the Blu-ray DVD player, and the test needs to be performed after the Blu-ray DVD player starts up. The test time is about 1.5 minutes per unit, which is longer and the test efficiency is lower. Contents of the invention [0003] In order to overcome the deficiencies in the prior art above, the present invention provides a multifunctional testing device based on a single-chip microcomputer system with shorter time and high testing efficiency. [0004] The purpose of the present invention is achieved through the following technical solutions: this multifunctional testing device based on a single-chip microcomputer system is characterized in that: it comprises a switching power supply, a test control board and a front-end control panel, the switc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 何勇强谢森初田鹏蔡文科
Owner 惠州德赛信息科技有限公司
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