Magnetic field generation device used for cold probe station

Abstract

The invention relates to a magnetic field generation device used for a cold probe station, and aims to overcome the defects of large size and inconvenience for carrying of the prior testing device. The invention provides the magnetic field generation device used for a cold probe station, which comprises a base, a sample support, and permanent magnets; two parallel screw are arranged above the base; sliding rods arranged on the screws can slide along the screws; the permanent magnets are oppositely arranged above the base, and respectively fixed on the base below one end of the screws and the middle part of the sliding rods through iron rings; and the sample support is arranged on the base in the center of the permanent magnets. the invention can adjust the magnetic strength and the magnetic direction in the position where a sample is placed; the size is small; the structure is simple; and the device is convenient to carry and easy to operate, can be seamlessly compatible with the coldprobe station, and is suitable for various small-volume environments in which magnetic field is needed, especially the microvacuum cold cavity of the cold probe station.

Description

technical field [0001] The invention relates to a device for generating a parallel magnetic field, in particular to a magnetic field generating device used in a cryogenic probe station. Background technique [0002] For more than half a century, semiconductor integrated circuits with CMOS as the mainstream technology have been developing rapidly following "Moore's Law", and their feature sizes have entered the nanoscale. Therefore, nanoelectronic devices based on new materials and new principles such as various quantum dots Devices, nanowires, nanotube devices, and single-electron devices have become research hotspots. In the characterization of these quantum devices, their low-temperature characteristics and characteristics in a magnetic field have become a commonly used characterization method. [0003] But in conventional testing equipment, low temperature and magnetic field characteristics are rarely accomplished simultaneously. Some devices that can be completed at th...

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Problems solved by technology

[0003] However, in traditional test equipment, low-temperature characteristics and magnetic field characteristics can rarely be completed simultaneously

Some devices that can be completed at the same time, also because of the shortcomings of the device that generates the magnetic field, such as large volume and not easy to carry, make the magnetic characteristic test under low temperature conditions not very popular.

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