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Method for automatically matching characteristic lines of close-range photogrammetry

A close-range photography and automatic matching technology, applied in the field of three-dimensional measurement, can solve the problems of limited measurement range and low measurement efficiency, and achieve the effect of avoiding loss of accuracy, avoiding the solution process, and improving accuracy and efficiency

Inactive Publication Date: 2009-10-21
AERODYNAMICS NAT KEY LAB
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Problems solved by technology

[0002] Three-dimensional measurement technology is a key supporting technology in reverse engineering, industrial inspection, quality control and other fields. Traditional contact measurement, such as three-coordinate measuring machines, has high measurement accuracy (up to about 1 micron), but generally has high environmental requirements. Requires a special measurement room and a dedicated measurement table, the measurement range is limited, the measurement efficiency is low, and it is not suitable for the measurement of objects with complex free-form surfaces or large products

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  • Method for automatically matching characteristic lines of close-range photogrammetry

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Embodiment Construction

[0032] Such as figure 1 As shown, a specific embodiment of the feature line automatic matching method for close-range photogrammetry of the present invention includes the following steps:

[0033] 1. According to the principle of CAD modeling technology, draw or paste marking lines on the surface of the measured object (including its outline), so that the color brightness is obviously different from the true color of the measured object, so as to facilitate image recognition;

[0034] 2. Use coded marking points (the marking points can be identified according to the coded information of the marking points through image processing) to identify the starting and ending points of the marking line of the measured object, and automatically identify the marking line;

[0035] 3. Use one or more digital cameras to take digital images of the measured object at different angles of view; use the beam adjustment method to accurately calculate the center of the coding mark point and the ca...

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Abstract

The invention discloses a method for automatically matching characteristic lines of close-range photogrammetry in order to have noncontact measurement of contour sides, molded surface control lines and other curves playing a key role in the surface of an object. The method does not need to adopt image curve resampling technology and optimization algorithm to search an optimal pixel point of a different visual photo showing a certain point of homologous curve, directly solves the matching problem of forming the point of the homologous curve in the different visual photo, avoids the time-consuming process of solving a nonlinear optimization equation and the precision loss in the image curve resampling process and promotes the precision and efficiency of the curve matching.

Description

technical field [0001] The invention relates to three-dimensional measurement technology, in particular to a method for automatic matching of feature lines of close-range photogrammetry. Background technique [0002] Three-dimensional measurement technology is a key supporting technology in reverse engineering, industrial inspection, quality control and other fields. Traditional contact measurement, such as three-coordinate measuring machines, has high measurement accuracy (up to about 1 micron), but generally has high environmental requirements. A special measurement room and a dedicated measurement table are required, the measurement range is limited, the measurement efficiency is low, and it is not suitable for the measurement of objects with complex free-form surfaces or large products. [0003] Digital close-range photogrammetry inherits the strict theory and method of traditional photogrammetry, and has high accuracy and reliability, and the hardware facilities are sim...

Claims

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Application Information

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IPC IPC(8): G01C11/00G01B11/00G01B11/24
Inventor 张征宇
Owner AERODYNAMICS NAT KEY LAB
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