Method and device for measuring angle of incidence of sunlight on basis of APS technology

A measurement method and sunlight technology, which are applied in the field of sunlight incident angle measurement based on APS technology, and can solve problems such as the reduction of calculation accuracy

Active Publication Date: 2009-12-09
北京天银星际科技有限责任公司
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Problems solved by technology

Therefore, if the calculation of the incident angle of sunlight is still performed according to equation (1) and equation (2), the calculation accuracy will decrease significantly with the increase of the angle

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  • Method and device for measuring angle of incidence of sunlight on basis of APS technology

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Embodiment Construction

[0027] Below in conjunction with accompanying drawing and embodiment the utility model is described in detail.

[0028] Such as figure 2 As shown, the APS solar sensor of the present invention includes a photosensitive detector 1 , a light introducer 2 and a cavity 3 between the photosensitive detector 1 and the light introducer 2 . The photosensitive detector 1 includes a protective glass 11 , an air-filled cavity 12 and photosensitive pixels 13 , and the protective glass 11 , gas-filled cavity 12 and photosensitive pixels 13 are packaged inside the photosensitive detector 1 and used as a whole. The air-filled cavity 12 is filled with air or nitrogen. The light introducer 2 includes a base 21 and a plurality of light holes 22 . The base 21 is transparent glass with a thickness of 1 mm, and one side of the transparent glass is evenly coated with a metal film with a thickness not exceeding 50 nm as the light shielding layer 23 . The metal film is an etchable metal, such as ...

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Abstract

The invention relates to a method and a device for measuring the angle of incidence of sunlight on the basis of APS (Active Pixels Sensor) technology. The method is characterized by comprising the following steps: fitting the data acquired by simulation in a laboratory to acquire the parameters in the polynomial equation for the tangent value of the angle of incidence of sunlight; pre-setting the parameters in a storage device. In the practical operation of the device of the invention, the related data acquired on a real-time basis is only needed to insert into the polynomial equation to acquire the tangent of the angle of incidence of the sunlight and working out the angle of incidence of the sunlight. Therefore, the measuring method of the invention has the characteristics of low calculated quantity and convenient use. The device of the invention comprises a photo-detector, a light introducer and a cavity between the photo-detector and the light introducer; wherein, the photo-detector comprises protective glasses, a gas-filled cavity and photosensitive pixels; the protective glasses, the gas-filled cavity and the photosensitive pixels are packaged inside the photo-detector. The method and the device of the invention for measuring the angle of incidence of sunlight are widely applicable to the attitude measurement and control system of a spacecraft.

Description

technical field [0001] The invention relates to the field of an attitude sensor, in particular to an APS technology-based sunlight incident angle measurement method and device for an attitude measurement control system on a spacecraft. Background technique [0002] The sun sensor is an important device for attitude measurement on spacecraft, and it has been widely used in the aerospace field, including space shuttles, earth satellites and deep space probes. In recent years, with the requirements of space missions, the requirements for the accuracy and reliability of spacecraft attitude measurement relative to the sun have become higher and higher, especially for systems that require high-precision imaging, such as reconnaissance satellites, resource and astronomical observation satellites, communication satellite. The high-precision measurement of the incident angle of sunlight can realize the accurate alignment of the solar panels of the spacecraft to ensure the maximum en...

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Application Information

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IPC IPC(8): G01C1/00B64G1/36
Inventor 邢飞尤政张高飞孙剑
Owner 北京天银星际科技有限责任公司
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