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Method for testing write frequency

A technology of write times and times, which is applied to the detection of faulty computer hardware, static memory, instruments, etc., and can solve problems such as the inability to determine the number of times storage units are written

Inactive Publication Date: 2010-02-24
INVENTEC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, the storage unit used to store the BIOS generally has a certain number of write times.
At present, the number of writes to the memory can only be based on the data provided by the manufacturer, and the motherboard manufacturer cannot determine the actual number of writes to the memory unit.

Method used

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Embodiment Construction

[0018] Generally, the write times of a memory unit can only be based on the data stated by its manufacturer, and it is impossible to know the actual write times of the memory unit. Accordingly, the present invention proposes a method for testing the writing times to test the writing times of the storage unit. In order to make the content of the present invention clearer, the following specific examples are given as examples in which the present invention can actually be implemented. However, those skilled in the art can implement the following embodiments in the form of a computer program, and use a computer-readable storage medium to store this computer program, so as to facilitate the execution of the computer system, and complete the test writing times in an electronic and automated manner. Methods.

[0019] figure 1 It is a flowchart of a method for testing write times according to an embodiment of the present invention. Please refer to figure 1 , first, in step S105, ...

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Abstract

The invention discloses a method for testing write frequency, which is suitable for testing the write frequency of a storage cell. The method comprises that: firstly, program codes in the storage cellare refreshed; when the refreshing of the program codes is successful, that the write frequency is greater than a given frequency or not is judged; and when the write frequency is not greater than the given frequency, the program codes are repeatedly refreshed until the write frequency is greater than the given frequency.

Description

technical field [0001] The invention relates to a method for testing a storage unit, and in particular to a method for testing the writing times of the storage unit. Background technique [0002] In a computer system, the Basic Input Output System (BIOS) plays an important role. In terms of current technology, after computer motherboards adopt flash memory (FlashMemory), electronically erasable programmable read-only memory (Electrically Erasable Programmable Read Only Memory, EEPROM) etc. as the storage unit of BIOS, users can Refresh the BIOS to upgrade the BIOS to improve system performance. [0003] However, the storage unit used to store the BIOS generally has a certain number of times of writing. Currently, the number of writes to the memory can only be based on the data provided by the manufacturer, and the motherboard manufacturer cannot determine the actual number of writes to the storage unit. Contents of the invention [0004] The invention provides a method ...

Claims

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Application Information

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IPC IPC(8): G11C29/50G06F11/22
Inventor 王志文王佩君
Owner INVENTEC CORP
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