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LabVIEW and PXI based automobile digital instrument testing system

A digital instrument and test system technology, which is applied in the field of automotive digital instrument test system, can solve problems such as incapable of professional testing, and achieve the effect of avoiding data loss

Inactive Publication Date: 2010-04-28
CHINA AUTOMOTIVE TECH & RES CENT
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  • Application Information

AI Technical Summary

Problems solved by technology

The automotive electronics TVS (Test and Verification) test system can only complete the general testing of automotive electronic products, but cannot conduct professional testing for the characteristics and test conditions of automotive digital instruments

Method used

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  • LabVIEW and PXI based automobile digital instrument testing system
  • LabVIEW and PXI based automobile digital instrument testing system
  • LabVIEW and PXI based automobile digital instrument testing system

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Embodiment Construction

[0036] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0037]The automobile digital instrument test system of the present invention is a kind of automobile digital instrument test system based on LabVIEW and PXI, and its development requirement is aimed at different car models, can simulate and produce various acquisition signal information required by the instrument, and can communicate with the received instrument through the CAN interface Measuring instrument to communicate.

[0038] The automobile digital instrument test system based on LabVIEW and PXI of the present invention includes the following main functions.

[0039] 1. Simulate the pulse signal generation of the speedometer;

[0040] 2. The pulse signal simulation of the engine tachometer is generated;

[0041] 3. Simulation of vehicle fuel gauge signal generation;

[0042] 4. Simulation of vehicle water temperature gauge s...

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Abstract

The invention discloses a LabVIEW and PXI based automobile digital instrument testing system, which comprises a LabVIEW graphical program compiling platform and a PXI hardware platform which are in charge of testing the automobile digital instrument to be tested, a speedometer, a tachometer of an engine, a fuel gauge, a water-temperature gauge, a switching value testing module, a user-customized CAN communication testing module which is used for testing and calibrating a digital instrument with a CAN interface to test a communication protocol and a calibration protocol, and a data communication switching card for calibrating parameters of the instrument to be tested and implementing data exchange between an interface of a controller serial port and the CAN interface of the automobile digital instrument to be tested, wherein a related board card is connected with a controller mainboard and is connected with the automobile digital instrument to be tested through a signal connector; the data communication switching card adopts a circulating queue-based buffering mechanism. The system can perform module testing on the speedometer, the tachometer, the water-temperature gauge, the fuel gauge and a switching value signal by modules, and also can perform integration testing on the digital instrument.

Description

technical field [0001] The invention relates to an automobile digital instrument test system, in particular to an automobile digital instrument test system based on LabVIEW and PXI. Background technique [0002] In the development process of automotive intelligent digital instruments, the amount of information collected by automotive digital instruments is relatively large, and the information parameters of various models are quite different. The existence of these problems has brought difficulties to the actual vehicle test and parameter calibration of the instrument. . [0003] The publication number is CN101509948, and its publication date is August 19, 2009. A Chinese invention patent application discloses an automotive electronics TVS (Test and Verification) test system and a test method thereof. The system includes the PXI hardware platform device responsible for testing the DUT; the information processing device used to automatically test and analyze the product; the...

Claims

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Application Information

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IPC IPC(8): G01D18/00G06F9/44
Inventor 张宏伟刘全周龚进峰王旭李艳文王文扬
Owner CHINA AUTOMOTIVE TECH & RES CENT
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