Satellite test data processing system

Abstract

A satellite test data processing system comprises a data setting module, a data obtaining module, a data processing module and a data displaying module. The telemetering parameters to be processed in the satellite automated test process is defined in the data setting module and can be stored in a local data file or on a network server; the data obtaining module reads the telemetering data in the database; the data processing module performs multilevel cache and non-linear extraction to the obtained data according to display requirement; and the data displaying module displays the data in the form of trend curve. The invention extracts mass data generated in the satellite test process scientifically and efficiently to facilitate a user to perform trend curve display to data of excessive time period and support comparision of multiple star data trend curves, so that the entire satellite automated test process can monitor, inquire, contrast and analyze the test data more conveniently.

Description

technical field [0001] The invention relates to a data processing system which facilitates real-time monitoring, historical query and comparison and analysis of parameters during satellite testing. Background technique [0002] With the continuous improvement of the level of scientific and technological development, the level of satellite launch has risen sharply, the division of satellite types has become more and more detailed, and the functions are different. New technologies are gradually applied to the field of satellite testing, and the equipment for satellite testing is also constantly updated and developed. A batch of old equipment is constantly being replaced by updates, which further tests the general performance of the satellite test system. [0003] Most of the existing satellite automatic test systems are self-contained closed structural systems. The parameter changes during the test process are realized by observing the parameter display on the screen. There ar...

AI Technical Summary

Problems solved by technology

[0003] Most of the existing satellite automatic test systems are self-contained closed structural systems. The parameter changes during the test process are realized by observing the parameter display on the screen. There are observation errors, especially the historical data display of parameter changes is not accurate and complete. Observing the screen for a long time is also easy to cause fatigue, such as missing key parameters and missing historical data.

Especially when testers query data in a long-term range, the system can only obtain massive data at one time and provide it to users according to conventional processing methods. The query takes a long time, takes up a lot of system resources, and even causes the server or test computer to crash. It is not convenient for personnel to view the trend changes of parameters over a long period of time after obtaining massive amounts of data

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