Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Organic electroluminescent diode service life tester

A diode and luminescence technology, which is applied in photometry, instruments, and measuring devices using electric radiation detectors, can solve problems such as inconvenient operation, automatic testing of organic electroluminescent devices, etc., to improve accuracy and stabilize test voltage and the effect of current

Inactive Publication Date: 2010-11-10
SHAANXI UNIV OF SCI & TECH
View PDF2 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there are few types of instruments used for OLED life measurement, and the operation in laboratories and factories is also very inconvenient. There is no device with relatively complete functions for automatic testing of the life of organic electroluminescent devices.
There are few types of OLED life measuring instruments in the prior art, which can provide measurement voltage to the device under test, or can only provide a fixed constant current output

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Organic electroluminescent diode service life tester
  • Organic electroluminescent diode service life tester
  • Organic electroluminescent diode service life tester

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] The present invention is described in further detail below in conjunction with accompanying drawing: figure 1 It is a connection block diagram of each part of the organic electroluminescent diode life detector of the present invention, as shown in the figure: the detector includes a microprocessor, a display and prompt circuit, a parameter setting circuit, a data storage circuit, a time base circuit, a temperature Measuring circuit, communication interface circuit, digitally controlled voltage output circuit 1, digitally controlled constant current source circuit 2 and measuring circuit 3. The microprocessor is respectively connected with the display and prompt circuit, the parameter setting circuit, the data storage circuit, the time base circuit, the temperature measurement circuit and the communication interface circuit. The numerically controlled voltage output circuit 1 and the numerically controlled constant current source circuit 2 are respectively connected to t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an organic electroluminescent diode service life tester, which comprises a microprocessor, a display and prompt circuit, a parameter setting circuit, a data storage circuit, a time-base circuit, a temperature measuring circuit, a communication interface circuit, a numerically controlled voltage output circuit, a numerically controlled constant current source circuit and a measuring circuit. The numerically controlled voltage output circuit provides voltages for a diode to be tested, and the numerically controlled constant current source circuit provides constant current for the diode to be tested; and the measuring circuit is connected with the diode to be tested so as to measure the voltage and luminous intensity of the diode to be tested. The tester provides adjustable voltage, outputs constant current under set voltage, sets a voltage value and a constant current value through an external keyboard, performs measurement and adjustment through the measuring circuit, provides the stable test voltage and current and improves the test accuracy. Besides, the tester can measure the environmental temperature of a sample to be tested, so the tester can correct a brightness test result by utilizing the temperature under the condition of high accuracy requirement.

Description

technical field [0001] The invention belongs to the field of detection of organic electroluminescent diodes, and relates to a detector, in particular to a detector for life detection of organic electroluminescent diodes. Background technique [0002] OLED display device is a light-emitting device with fast response speed and no viewing angle, but it is also an organic substance, which has problems such as aging and service life. Therefore, service life has become a key factor restricting OLED. In the development process of OLED display devices, the measurement of its lifetime is an important index to characterize the performance of the device. At present, there are few types of instruments used to measure the lifetime of OLEDs, and the operation in laboratories and factories is also very inconvenient. There is no device with relatively complete functions for automatic testing of the lifetime of organic electroluminescent devices. There are few kinds of OLED lifetime measuri...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01J1/42G01K7/22
Inventor 党宏社张芳张震强张方辉
Owner SHAANXI UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products