Combination device for infrared temperature measurement of high-voltage switch cabinet

Abstract

The invention relates to a high-voltage switch cabinet of a transformer substation of a power system, and discloses a combination device for the infrared temperature measurement of the high-voltage switch cabinet. The combination device comprises an infrared imaging temperature measurer and an organic glass plate arranged on an observation window of the switch cabinet. The combination device is characterized in that: the organic glass plate is provided with a spherical universal joint which consists of a base and a sphere embedded into the base; through holes used for detection are sequentially reserved on the sphere, the base and the organic glass plate; and an emission barrel of the infrared imaging temperature measurer is inserted into the through hole of the sphere.

Description

technical field [0001] The invention relates to a high-voltage switchgear of a power system substation, in particular to a combination device for infrared temperature measurement of a high-voltage switchgear. Background technique [0002] At present, the high-voltage switchgear operating in 10kV and 35kV substations is an integrated structure with fully enclosed busbar connection and contact contact insertion (the busbar drainage contacts in the cabinet are fully enclosed and heat-shrinked to form multiple electrical equipment connections in the cabinet), inside the cabinet There are multiple contacts and temperature changes in the contact parts of the contacts. Because there is no corresponding reliable temperature rise and temperature measurement device, operators generally use infrared imaging thermometers for measurement. However, the infrared imaging thermometer can only be tested through the plexiglass inlaid on the observation window behind the high-voltage switchgear...

AI Technical Summary

Problems solved by technology

However, the infrared imaging thermometer can only be tested through the plexiglass inlaid on the observation window behind the high-voltage switchgear cabinet. The material and thickness of the plexiglass affect the measurement accuracy of the infrared imaging thermometer. Therefore, the infrared imaging thermometer The change of the elevation angle during the test of the instrument causes the thickness change of the infrared ray to pass through the plexiglass, which makes the measurement data of different measurement personnel or each time have randomness, resulting in the measurement data cannot correctly reflect the actual change of the temperature of the contact or the contact, which seriously affects the power grid equipment reliable and safe operation

Images