IC pin open short circuit test method

Abstract

The invention relates to an IC (Integrated Circuit) pin open short circuit test method. The method comprises the following steps of: selecting any pin of an IC chip to be tested and supposing that the pin is a pin VDD, and selecting any more than two pins from the other pins as the comparison pins; grounding the supposed pin VDD or connecting the supposed pin VDD with 0V voltage, and respectively providing a constant current to the comparison pins; detecting the voltage of each comparison pin, determining that the supposed pin VDD is a real pin VDD if the voltage value of one comparison pin is 0.3-1.3V, but not vice versa; and repeating the steps till all the real pins VDD are detected if the supposed pin VDD is not a real pin VDD. The detection method of a pin VSS is similar to the test method of the invention. After all the pins VDD and all the pins VSS are detected, an open short circuit characteristic test is performed to the other pins on the IC chip to be tested. The invention is simple and easy to operate, accurate and effective, low in cost, and widely suitable for complex integrated circuits.

Description

technical field [0001] The invention relates to an IC pin open-short test method applied in the fields of IC package detection, IC die binding detection and the like. Background technique [0002] Open short test (open_short_test, also known as continuity test or contact test) is a very fast way to find out whether the connection of each pin of the chip is normal and whether there are missing bond wires (binding failure) when the chip is packaged. It can also find the test Whether the contact is good, whether there is a problem with the probe card or the test socket. [0003] The test principle of open short circuit test is relatively simple, divided into open_short_to_VDD test and open_short_to_VSS test. Generally speaking, each pin of the chip has a discharge or protection circuit, which is equivalent to two diodes connected end to end, with one end connected to VDD and the other end connected to VSS, and the signal comes in from the junction of the two diodes. [0004] ...

AI Technical Summary

Problems solved by technology

However, due to the fact that there are so many OEM manufacturers engaged in product circuit testing in the market, the test system developers of OEMs and product designers of chip design companies often cannot communicate and give feedback in a timely and effective manner, resulting in delays in testing. Problems related to program development or development and testing systems are not perfect, which makes it impossible to test the chip in a timely and effective manner

Images