Testing system and method

Abstract

The invention discloses a testing system and a testing method. The testing system comprises a tested module, at least one press and a control module, wherein the tested module is divided into a plurality of logic storage units; each press is used for testing input output (IO) performance of at least one logic storage unit; and the control module is used for setting a testing model for each logic storage unit and controls at least one of the plurality of presses to test the IO performance of each logic storage unit according to the testing model.

Description

technical field [0001] The content disclosed in this application relates to a test system and a test method Background technique [0002] In the prior art, the maximum IOPS (reading and writing times per second) of the device mentioned by the manufacturer is usually measured by a "black box" test method that does not disclose the specific configuration details of the device under test. Specifically, a test file whose size is not much different from the Cache of the device under test is generated on the device under test, and the generated test file cannot guarantee that all logical storage units (LUNs) can be traversed. Since the generated test files are only distributed on some LUNs, when the read IO test is performed, after the first read IO operation, the file is loaded into the Cache, and subsequent reads and writes are all completed in the Cache, so the results are all Cache IOPS; when performing the write IO test, the device under test also writes the data directly in...

AI Technical Summary

Problems solved by technology

Specifically, generate a test file on the device under test that is not much different from the Cache size of the device under test. The generated test file cannot guarantee that all logical storage units (LUNs) can be traversed.

Since the generated test files are only distributed on some LUNs, when the read IO test is performed, after the first read IO operation, the file is loaded into the Cache, and subsequent reads and writes are all completed in the Cache, so the results obtained are all Cache IOPS; when performing the write IO test, the device under test also writes the data directly to the Cache, and returns an indication of a successful write operation, and then the device under test performs a disk write operation when the CPU is idle according to its own algorithm; thus, during the test The real disk write IO processing performance cannot be obtained, nor can the actual write time from cache to disk in the write cache algorithm of each tested device

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