Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Self-checking method and system for arithmetic device

A computing device and detection method technology, applied in measuring devices, detecting faulty computer hardware, measuring electrical variables, etc., can solve the problems of detection and sequential display, inconvenience, etc., to simplify the board layout design and reduce costs Effect

Inactive Publication Date: 2011-05-11
INVENTEC CORP
View PDF0 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the conventional technology, there is no detection of the voltages of the voltage levels of each electronic component before the BIOS operation, and the corresponding messages are displayed in sequence for the user to judge. When debugging the system, there are still inconveniences

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Self-checking method and system for arithmetic device
  • Self-checking method and system for arithmetic device
  • Self-checking method and system for arithmetic device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The relevant detailed structure of the device of the present invention and the reason for the design concept are described below, and the detailed description is as follows:

[0020] see figure 2 As shown, the figure is a schematic diagram of the architecture of a computing device of the present invention. The computing device 2 has a main control board 20, on which there are various electronic devices, such as: a central processing unit 21, a memory 22 (such as: DDR2 or DDR3, etc.), an input / output hub 23 (I / O Hub, IOH) (or called the north bridge chip) and an input / output hub controller 24 (I / O controller hub, ICH) (or called the south bridge chip), but not limited thereto. Generally speaking, the input / output hub (IOH) 23 is connected to a relatively high-speed device, such as a memory or a display card, via a bus. The bus includes Peripheral Component Interconnect (PCI) or Advanced Graphics Port (AGP) interface and other bus types, but is not limited thereto. Th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a self-checking method and system for an arithmetic device. In a starting process of the arithmetic device, the method comprises the steps of: receiving a state signal related to a voltage ranking state, corresponding to each electronic element, and then displaying a message corresponding to each first state signal so as to provide a reference for detecting a starting state. By means of the self-checking method and system, an existing debugging architecture can be utilized to complete the detection of the voltage ranking state, therefore, non only can the search of an abnormal location be assisted, but also the advantages of easiness of operation and low cost can be achieved.

Description

technical field [0001] The present invention relates to a detection method and system, in particular to a self-detection method and system for a voltage state during startup of a computing device. Background technique [0002] With the development and progress of the industry, the demand for electronic computing devices in various applications is gradually increasing. For example: in the information technology industry, due to the development of the network and the expansion of the scale of small and medium-sized regional networks within the company, the network service system has more professional requirements, and thus the functionality and ease of use of the network service system have been improved. In addition, with the pace of digitization, the demand for data servers in various enterprises has also increased significantly. Data servers can be used as a platform for data storage and reading, so that data can be saved or information required for statistical analysis can...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G01R19/00
Inventor 朱威峄黄柏学
Owner INVENTEC CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products