Method and device for measuring total hemispherical emissivity of non-metallic material

Abstract

The present invention relates to the technical field of measurement of thermal physical parameters of a material, in particular to a method and a device for measuring total hemispherical emissivity of a non-metallic material. The measurement method comprises the following steps: selecting a center area in the middle section of a multi-section combined and cylindrical sleeve-shaped sample to be tested as a target analysis area in a vacuum environment; embedding a powered heating module into the sample to be tested in a penetrating way; and calculating the total hemispherical emissivity throughmeasuring the geometric dimensions of the middle section of the sample to be tested, the geometric dimensions of the target analysis area, the internal temperature of the vacuum environment in a thermal equilibrium state, and the surface temperature and the heat power of the middle section of the sample to be tested and the target analysis area. Since the heating module is embedded in the cylindrical sleeve-shaped sample to be tested, the demands are satisfied for measurement of the total hemispherical emissivity of the non-metallic material at high temperature, and the present invention has the advantages that the measurement device has a simple structure and high-precision measurement data can be obtained.

Description

technical field [0001] The invention relates to the technical field of measuring thermophysical parameters of materials, in particular to a method and device for measuring the hemispherical total emissivity of non-metallic materials. Background technique [0002] Hemispherical total emissivity is one of the important thermophysical parameters of materials, which characterizes the thermal radiation ability of the material surface, and is an important basic physical property data for the study of radiative heat transfer and thermal efficiency analysis. In the high-tech fields such as aerospace and energy power, new high-temperature resistant non-metallic materials are widely used. However, as the thermal physical property data to characterize the performance of materials, the high-temperature hemispherical emissivity of non-metallic materials is very scarce. [0003] At present, the measurement methods can be mainly divided into card meter method, reflectivity method, energy c...

AI Technical Summary

Problems solved by technology

[0012] The technical problem to be solved by the present invention is to provide a simple and reliable method and device for measuring the high-temperature hemispherical total emissivity of non-metallic materials, which overcomes that the existing hemispherical total emissivity measurement method cannot be applied to high-temperature non-metallic materials, and the device Disadvantages such as complexity and low test accuracy

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