On-chip clock uncertainty measurement circuit device and system
A technology of uncertainty and measurement circuit, which is applied in the field of measurement of chip clock uncertainty, can solve problems such as large noise, large data volume circuit scale, process dependence, etc., and achieve high measurement accuracy, less control data, and large measurement range Effect
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[0041] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the following describes the measurement circuit device and system with uncertain on-chip clock of the present invention in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0042] The circuit device and system for measuring the uncertainty of the on-chip clock in the embodiments of the present invention utilize the principle of a delay-locked loop (Delay-Locked Loop). The on-chip clock uncertainty measurement system of the embodiment of the present invention includes two parts: an on-chip clock uncertainty measurement circuit device 1 (Skew and Jitter Measurement, SJM); and a scale circuit (Ring).
[0043] Among them, the on-chip clock uncertainty measurement circuit device is used to measu...
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