On-chip clock uncertainty measurement circuit device and system

Abstract

The invention provides an on-chip clock uncertainty measurement circuit device. The device comprises a delay circuit and a detection unit, wherein the delay circuit comprises a rough adjustment circuit and a fine adjustment circuit; two paths of clock signals A and B to be measured from two different measurement points of the same time source on a chip are roughly adjusted and delayed by the rough adjustment circuit; the roughly adjusted clock signals A and B are finely adjusted and delayed by the fine adjustment circuit; the phases of the finely adjusted clock signals A and B are detected bythe detection unit; and the clock skew of the clock signals A and B is calculated when the phases of the finely adjusted clock signals A and B are the same. The invention also provides a measurement system which comprises the measurement circuit device and a ruler circuit. In the invention, on-chip measurement is performed on the clock skew and even clock jitter by using a composite non-linear delay line, so the measurement accuracy is high and the required data quantity is small.

Description

technical field [0001] The invention relates to the technical field of measurement of chip clock uncertainty, in particular to an on-chip measurement circuit device and system of a microprocessor capable of measuring clock deviation or even clock jitter. Background technique [0002] Computers today use clocks a lot, for example, to make sure that many operations happen in the correct order or in sync. Therefore, it is important that the clocks themselves operate close to synchronously. Typically, the two clocks are not perfectly synchronized and there are timing differences between the clocks. Additionally, the timing difference between the two clocks varies over time. This change in clock timing difference is known as clock skew or clock skew. Many computer timing protocols require information such as the time offset between two clocks. [0003] On-Chip Clock Uncertainty Measurement (On-Chip Clock Uncertainty Measurement) system is suitable for processing a large amoun...

AI Technical Summary

Problems solved by technology

However, this method needs to store and calculate a large amount of data, and at the same time needs to introduce another frequency clock, which is very difficult in practice, so there is no large-scale industrial application at present

[0010] After analysis, it is found that these existing technologies mainly use a single linear delay method to adjust the clock. The main problem they face is that the measurement range and measurement accuracy are small, and the amount of data to be processed and the required circuit scale are also relatively large. Big

Also, longer delay lines introduce more noise

And for a circuit like SKITTER, it is too dependent on the process, and it needs to use a specific process to achieve its measurement accuracy, which is not universal

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