TSV (through silicon via) chip bonding structure
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- PEKING UNIV
- Publication Date
- 2011-08-17
- Estimated Expiration
- Not applicable Β· inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a TSV (Through Silicon Via, through-silicon via) chip three-dimensional integration technology, in particular to a design of a TSV bonding layer structure, and belongs to the field of microelectronic technology. Background technique
[0002] Today's semiconductor industry generally believes that TSV-based chip three-dimensional integration technology is one of the important technologies that can make chips continue to develop along the blueprint of Moore's Law. For the stacking of TSV chips, one of the common and reliable methods at present is to perform intermetallic bonding between micro bumps (micro bumps) through solder to form an intermetallic compound (IMC). IMC has a higher melting point and can be bonded to another layer of chips.
[0003] Such as figure 1 As shown, 101 and 102 are TSV chips, 103 and 104 are conductive vias, and 105 and 106 are conductive micro-bumps. Generally, 105 and 106 are bonded by solder 107 ....