Method for measuring and calculating interface resistivity of Pb-Sn-Al laminated composite material
A pb-sn-al, layered composite technology, applied in the direction of measuring resistance/reactance/impedance, measuring electrical variables, measuring devices, etc. Simple and easy to operate effect
Inactive Publication Date: 2011-11-16
KUNMING UNIV OF SCI & TECH
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However, this qualitative analysis does not play a real guiding role or testing significance for revealing the influence law between the conductivity of the interface and the process parameters (such as temperature, pressure, time, composition, etc.) of the prepared material.
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Abstract
The invention relates to a method for measuring and calculating interface resistivity of a Pb-Sn-Al laminated composite material, belonging to the technical field of measurement and calculation of interface resistivity of the laminated composite materials. It is assumed that an interface non-contact resistor exits and a material to be measured has Pb-Al material reference bodies with same shapes and cross section areas, the total resistance of the material to be measured and resistances RA1 and RPb of Al and Pb matrix materials are measured through a four-point collinear probe-method resistance-measuring method; through a scanning electron microscope microscale calibration technique, Pb matrix width 1'Pb, Al matrix width 1Al, single-side interface width 1 interface and cross section area s of the material to be measured are measured, and resistivity of Al and Pb matrixes of the Pb-Sn-Al laminated composite material to be measured is figured out; and through a formula, a reference bodyresistance is obtained and according to the formula, the interface resistivity is calculated. The method has the advantages of convenience for operation, simpleness and easiness in a computing method, capability of enabling the interface width of the measured laminated composite blocky material to reach below micrometer, and the like.
Description
technical field The invention relates to a method for measuring and calculating the interface resistance of Pb-Sn-Al metal layered composite materials, combined with the four-point collinear probe method to measure the resistance of block materials and scanning electron microscope microscale calibration technology, obtained by indirect measurement and calculation method The invention relates to the resistivity of the Sn interface with a micron-order width, belonging to the technical field of measuring and calculating the interface resistivity of metal layered bulk materials. Background technique At present, for the accurate measurement of the resistance of bulk materials with very small resistance, there are low-voltage and low-resistance measuring instruments such as KEITHLEY and other brands with high precision, which use the four-point collinear probe method (also known as the four-terminal connection method). The principle is to measure bulk resistance, and the minimum m...
Claims
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IPC IPC(8): G01R27/02
Inventor 周生刚竺培显孙勇段永华
Owner KUNMING UNIV OF SCI & TECH