Computer-aided management device, method and system for integrated circuit detection
A computer-aided and integrated circuit technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problem of low precision and achieve the effect of avoiding low precision
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[0020] figure 1 It shows a structural principle diagram of a computer-aided management device for integrated circuit detection according to the first embodiment of the present invention. Specifically, in this embodiment, the computer-aided management device 1 for integrated circuit detection includes a workbench control device, a tray control device, a light source control device, an image acquisition device 2 , and a dimension measurement device 3 . Wherein, the workbench control device is used to adjust the vertical position and horizontal position of the workbench; the tray control device is used to adjust the levelness of the tray; the light source control device is used to control the light source so that the gray value of the measurement area falls within within the allowable fluctuation range of the target gray value; the image acquisition device 2 is used to amplify and collect the image of the observed object; the size measuring device 3 is used to output geometric si...
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