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A method for improving the sensitivity of an infrared push-broom imaging system

An imaging system and imaging method technology, applied in the field of high-sensitivity infrared imaging, can solve problems such as difficulty in improving sensitivity and inability to achieve long-term integration, and achieve the effect of improving flexibility

Active Publication Date: 2011-12-07
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

Compared with the longer pixel dwell time of space remote sensing, long-term integration cannot be achieved, which makes it difficult to improve the sensitivity of the system

Method used

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  • A method for improving the sensitivity of an infrared push-broom imaging system
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  • A method for improving the sensitivity of an infrared push-broom imaging system

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Embodiment Construction

[0023] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0024] The method of the present invention is as figure 1 It is realized on the hardware platform of the infrared imaging system shown. The infrared image is converged and imaged on the focal plane of the detector through the optical system. First, the bias voltage and digital drive signal required by the detector are generated by the drive circuit, and the output analog image signal is filtered and amplified before being transmitted to the A / D is quantified, and then digital time delay integration processing is performed through FPGA, and finally the infrared sequence image is stored by using the turntable push broom imaging.

[0025] Among them, the effective aperture of the optical system is 37.5mm, the focal length is 75m, the F number is 2, the instantaneous field of view is 0.4mrad, and the total field of view is 7.3°.

[0026] The area array...

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Abstract

The invention discloses a method for improving sensitivity of an infrared push-scanning imaging system, which is a novel imaging method based on the digital time delay integration. In the method, an infrared two-dimensional array probe is used for imaging in a linear-array push-scanning manner; one dimension of the two dimensions is used as a serial scanning dimension while the other dimension ofthe two dimensions is used as a push scanning dimension. A pixel voltage value which serially scans a same scenery during a push scanning process is read out by a read-out circuit inside the probe; the pixel voltage value is digitally accumulated and normalized inside an FPGA (Field Programmable Gate Array) after being amplified and quantized in an information obtaining circuit; the normalized image is transmitted to a storage medium. In an M-order infrared system of the digital time delay and integration, if noise inside the probe or noise of the information obtaining circuit is main noise, a signal to noise ratio of the system is proportional to M1 / 2; and if background photon noise is the main noise, the signal to noise ratio of the system is superior to M1 / 2.

Description

technical field [0001] The invention relates to an infrared imaging technology, specifically a high-sensitivity infrared imaging method for push-broom imaging. It is applied to the acquisition of high-sensitivity infrared images. Background technique [0002] The improvement of the detection sensitivity of the infrared imaging system is an important and long-term development direction. Improving the sensitivity of the detection system is of great significance for increasing the detection distance and detecting weak signals. The sensitivity of the infrared system is not only related to the system imaging mode and the optical aperture of the optical system, but also related to the detection rate of the detector, the integration time and the noise of the electronic system. Among them, the sensitivity and integration time of the infrared system are directly related. To expand the integration time of the system, in addition to developing technologies such as detectors and other...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/33
Inventor 谢宝蓉傅雨田赵龙成刘云芳王凯周青朱鹏
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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