2 results about "Serial scanning" patented technology

This utility model discloses a serial scanning box test system, relating to the field of serial scanning box test technology. It includes a controller module, an RS485 communication module, a setting module, a storage module, an isolation drive module, a switching control module, a DC-DC power supply module, and an AC-DC power supply module. The controller module is connected to the RS485 communication module, the setting module, the storage module, the isolation drive module, and the DC-DC power supply module. The AC-DC power supply module converts AC voltage to 24V DC voltage, and the DC-DC power supply module converts 24V DC voltage to 5V and 3V DC voltage. The system enables the controller module to receive test signals transmitted from the host via the RS485 communication module, control the isolation drive module and the multi-channel drive switching control module to perform withstand voltage tests, and transmit the withstand voltage results to the host.

The application relates to the technical field of electric digital data processing, and discloses a BIM-based indoor decoration component rapid arrangement system and method, which comprises the following steps: an heuristic axial one-dimensional projection vector calculation module acquires space surrounding step length data and checks address bit codes, and when sections do not overlap with each other, a high-dimensional conflict graph network matrix is cut to generate a discrete topological sparse matrix; a dynamic feedforward hierarchical truncation control module calculates a local graph density scale value according to a memory throughput variable, a space dynamic boundary isolation module is activated to isolate a local topological subgraph matrix when the scale value is greater than 0.85, and a serial scanning flow is locked when the scale value is not greater than 0.85; and an arrangement state mapping solution module solves linear algebra mapping based on the sparse matrix to generate a coordinate control instruction. The application reduces the topological matrix solving complexity, suppresses memory throughput overload, and guarantees the stable convergence output of arrangement instructions.