Apparatus and methods for one or more wavelength swept lasers and the detection of signals thereof

A wavelength scanning and laser technology, used in lasers, semiconductor lasers, laser parts and other directions, can solve the problems of no detection and processing, no existence, etc.

Active Publication Date: 2018-08-31
THORLABS INC +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0019] While many applications may benefit from using output from multiple wavelength-swept lasers and there are teachings on generating light from multiple wavelength-sweeping lasers, there is little or no knowledge on how to efficiently detect and process light sources from multiple wavelength-sweeping lasers. Discussion or Experimental Demonstration of Light

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  • Apparatus and methods for one or more wavelength swept lasers and the detection of signals thereof
  • Apparatus and methods for one or more wavelength swept lasers and the detection of signals thereof
  • Apparatus and methods for one or more wavelength swept lasers and the detection of signals thereof

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Embodiment approach

[0127] Figure 15A A block diagram of one embodiment of the invention is shown. One embodiment of the invention is an optical instrument comprising: a first VCL light source 1505 configured to generate tuned emissions over a first wavelength range to generate a first wavelength sweep; and a second VCL light source 1510 configured to Tuned emissions are generated over a second wavelength range to generate a second wavelength sweep. Such as Figure 15B As shown, a portion of the tuned emission from the first VCL (VCL light source 1 ) is directed to the optical system 1515 and sample 1520 , while another portion of the tuned emission is directed to the reference signal generator 1525 . Similarly, as in Figure 15C As shown, a portion of the tuned emission from the second VCL (VCL light source 2 ) is directed to optical system 1515 and sample 1520 , while another portion of the tuned emission is directed to reference signal generator 1525 . There are many different ways to spl...

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Abstract

An optical instrument including at least a first and second wavelength swept vertical cavity laser (VCL) sources. The wavelength sweeping ranges spanned by the first and second VCL sources may differwith a region of spectral overlap. The first and second VCL sources may be operable under different modes of operation, wherein the modes of operation differ in at least one of: sweep repetition rate,sweep wavelength range, sweep center wavelength, and sweep trajectory. A VCL source may also exhibit sweep-to-sweep variation. Apparatus and methods are described for aligning sample signal data fromthe first VCL and sample signal data from the second VCL to generate output digital data. The output digital data is aligned with respect to at least one of: wavelength, wavenumber, and interferometric phase. The apparatus and methods can also be used to phase stabilize successive sweeps from the same VCL source or wavelength swept source.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of U.S. Provisional Patent Application No. 62 / 218,118, filed September 14, 2015. The disclosure of US Provisional Patent Application 62 / 218,118 is hereby incorporated by reference herein. technical field [0003] This invention relates to the field of optical instruments using one or more wavelength-swept lasers and the detection and alignment or combination of their signals or both. Background technique [0004] Various products, devices and instruments use wavelength-swept laser technology as a source of electromagnetic emission. For example, swept-source optical coherence tomography (SS-OCT), also known as optical frequency-domain imaging (OFDI), uses wavelength-swept lasers for interferometric imaging and ranging. Another example (infrared laser spectroscopy) uses wavelength-swept lasers to perform spectroscopy. Different material systems have been used as gain media for wavel...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B9/02A61B5/00H01S5/183
CPCG01B9/02083G01B9/02091H01S5/4012G01B9/02004G01B9/02007H01S5/426G01B2290/60H01S5/423H01S5/18366
Inventor A·凯布尔V·贾亚拉曼J·蒋B·波特赛义德
Owner THORLABS INC
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