Method and device for measuring electrical characteristics of solar cells

A technology of solar cells and measurement devices, which is applied in the monitoring of electrical components and photovoltaic systems, and measurement using digital measurement technology, which can solve problems such as low efficiency of solar cells, reduce errors, and improve measurement efficiency.

Inactive Publication Date: 2011-12-28
INST OF COMPUTING TECH CHINESE ACAD OF SCI
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  • Abstract
  • Description
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Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a method and device for measuring the electrical chara...

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  • Method and device for measuring electrical characteristics of solar cells
  • Method and device for measuring electrical characteristics of solar cells
  • Method and device for measuring electrical characteristics of solar cells

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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] The inventor found through experiments that by automatically simulating the battery load change process, the output power information (voltage and current information) of the battery changing with the load can be measured, including the I-V characteristic curve of the solar battery, especially the open circuit voltage, short circuit current and maximum power. The voltage value and current value of the output point. Therefore, the electrical characteristics of the solar cell can be automatically measured, and then the solar panel can be guaranteed to output energy at the maximum power.

[0030] According to...

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Abstract

The invention provides a method for measuring the electrical characteristics of a solar cell, comprising: step 1, electrically connecting the solar cell to be tested with an electronic load to form a circuit; step 2, using a control unit to change the resistance value of the electronic load to simulate the formed circuit The working state of the circuit from open circuit to short circuit; and Step 3, during the change process of the above resistance value, collecting the voltage value and current value sequence output by the battery to be tested. A measuring device is also provided, including: an electronic load, adapted to provide a load for the battery under test; a voltage acquisition unit, adapted to acquire the voltage of the battery under test; a current acquisition unit, adapted to acquire the voltage of the battery under test and a control unit adapted to send a control signal to the electronic load to change the resistance of the electronic load, while receiving voltage and current values ​​from the voltage acquisition unit and the current acquisition unit. The measurement efficiency is improved, errors are reduced, and real-time detection is possible.

Description

technical field [0001] The invention relates to solar cell measurement technology, in particular to a method and device for measuring the electrical characteristics of a solar cell. Background technique [0002] At present, with the increasing shortage of energy sources and the aggravation of pollution, solar energy is being utilized on a large scale as an easy-to-obtain, high-energy-density, and pollution-free green energy source. A solar cell is a device that directly converts light energy into electrical energy by using the photovoltaic effect at the interface of a semiconductor. It does not require complex large-scale equipment and can have relatively high power generation efficiency. The conversion efficiency of a general solar cell is about 17%, and the energy density per unit area is about 18mW / cm2 under the condition of direct sunlight. [0003] The research and development of solar cells is not only the manufacturing technology of solar cells, but also the evaluati...

Claims

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Application Information

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Owner INST OF COMPUTING TECH CHINESE ACAD OF SCI
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