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Fine particle detector and light emitting apparatus

A detection device, light irradiation technology, applied in measurement devices, fluorescence/phosphorescence, individual particle analysis, etc., can solve problems such as different effective intensities, signal intensity errors, etc.

Inactive Publication Date: 2012-03-14
SONY CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If the delivery position of the particles P in the sample flow S changes, the effective intensity of the irradiation laser between the particles P passing through the center of the laser spot and the particles P passing through the periphery of the laser spot is different, so the obtained signal intensity introduce error in

Method used

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  • Fine particle detector and light emitting apparatus
  • Fine particle detector and light emitting apparatus
  • Fine particle detector and light emitting apparatus

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Embodiment Construction

[0024] Embodiments of the present invention will be described with reference to the drawings. Since the embodiments described later are merely examples of typical embodiments of the present invention, these examples do not limit the scope of the present invention. The description will proceed in the following order:

[0025] 1. Particle detection device according to the embodiment

[0026] 2. Particle detection device according to another embodiment

[0027] 1. Particle detection device according to the embodiment

[0028] Figure 1A and Figure 1B Each shows the structure of the light irradiation system of the microparticle detection device according to the embodiment of the present invention.

[0029] exist Figure 1A and Figure 1B Among them, the light (laser light) emitted from the light source 1 is coupled into approximately parallel light by the collimator lens 2, passes through the phase difference element 4, and is focused by the focusing lens 3 on the sample f...

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Abstract

The present invention discloses a fine particle detector and a light emitting apparatus. The fine particle detector includes a light emitting system letting light from a light source pass through a phase difference element and focusing the light on a sample flow through which fine particles flow. When the direction of the sample flow is an X-axis direction, the light is emitted to the sample flow in a Z-direction, and a ZX-plane is orthogonal to a Y-direction, then the phase difference element has a plurality of regions divided in the Y-axis direction and causes a phase difference between wavefronts of the light passing through the plurality of regions.

Description

technical field [0001] The present invention relates to a microparticle detection device and a light irradiation device, and more particularly, to a microparticle detection device and the like for optically analyzing properties of microparticles such as cells or microbeads. Background technique [0002] A conventional particle detection device irradiates light (laser light) to particles flowing in a flow cell or flow path formed on a microchip, and detects light scattered from the particles or fluorescence generated by the particles themselves or fluorescent substances labeled on the particles , and measure the optical properties of the particles. In addition, the microparticle detection device separately collects groups that have been judged to satisfy predetermined conditions from among the microparticles as measurement results of optical characteristics. As for such particle detection devices, devices that measure optical properties of cells as particles or separately co...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/14G01N21/41G01N21/64G01N21/01
CPCG01N15/1434G01N15/1459
Inventor 堂胁优
Owner SONY CORP