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Ic current measurement device and ic current measurement adapter

An integrated circuit, current measurement technology, applied in the direction of measurement device, electronic circuit test, printed circuit test, etc., can solve the problem of inability to measure the current of multiple terminals

Active Publication Date: 2012-05-23
PANASONIC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] However, in the prior art described above, although the total amount of current flowing through the IC can be measured by the connected ammeter, the current flowing through the plurality of terminals of the IC cannot be measured individually.

Method used

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  • Ic current measurement device and ic current measurement adapter
  • Ic current measurement device and ic current measurement adapter
  • Ic current measurement device and ic current measurement adapter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0031] Hereinafter, as an embodiment of the device for measuring IC current of the present invention, an IC current for measuring the current flowing through each power supply terminal of an IC packaged in a BGA (Ball Grid Array) package and provided with 25 terminals in total at 5×5 will be described. Device for measurement.

[0032] The IC current measuring device is installed between the IC and the substrate, so that each IC terminal is electrically connected to each corresponding substrate terminal, especially for the power supply terminal, each between the power supply terminal of the IC and the power supply terminal of the corresponding substrate. A 1Ω resistor is interposed in the current path.

[0033] In addition, the device for measuring IC current includes a terminal for measuring the potential difference between both ends of each interpolation resistor.

[0034] Therefore, the measurer who measures the current flowing through the power supply terminal of the IC in...

Embodiment approach 2

[0106] Hereinafter, as an embodiment of the IC current measuring device of the present invention, a first modified IC current measuring device of Embodiment 2 obtained by modifying a part of IC current measuring device 100 of Embodiment 1 will be described.

[0107] In the device 100 for measuring IC current, the pair of lead-out terminals is used to measure the difference between the potential of the upper end and the potential of the lower end of the resistance element, while in the device for measuring IC current of the first modification, the pair of lead-out terminals is used to measure The difference between the potential at the upper end of the resistive element and the ground potential is measured.

[0108] Hereinafter, the configuration of the first modified IC current measuring device according to the second embodiment will be described with reference to the drawings, focusing on differences from the IC current measuring device 100 according to the first embodiment. ...

Embodiment approach 3

[0122] Hereinafter, as an embodiment of the IC current measuring device of the present invention, a second modified IC current measuring device of Embodiment 3 obtained by modifying a part of the first modified IC current measuring device 500 of Embodiment 2 will be described.

[0123] In the first modified IC current measuring device 500, the lead-out terminal on the outer peripheral side of the pair of lead-out terminals is the lead-out terminal for measuring the ground potential, while in the second modified current-measuring device, the lead-out terminal for measuring the ground potential is replaced. The terminals are drawn out, and a linear electrode for measuring the ground potential is arranged on the main surface of the IC 101 side.

[0124] Hereinafter, the configuration of the second modified IC current measuring device according to the third embodiment will be described with reference to the drawings, focusing on differences from the first modified IC current measur...

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PUM

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Abstract

The disclosed IC current measurement device is mounted between an IC and a substrate, and electrically connects the terminals of the IC with the corresponding terminals of the substrate. A resistance is inserted into the electrical connection path between those IC terminals to be measured and the corresponding substrate terminals. Furthermore, the IC current measurement device is provided with terminals for measuring the potential difference of both ends of the inserted resistances. Thus, the person measuring the current flowing through the IC terminals can mount the IC current measuring device between the IC to be measured and the substrate, and is able to measure the current flowing in the IC terminals by measuring the potential difference between the both ends of the inserted resistances corresponding to the terminals of the IC to be measured.

Description

technical field [0001] The present invention relates to an IC current measuring device for measuring a current flowing through an IC (Integrated Circuit). Background technique [0002] A technique for measuring the current consumed by an operating IC is known. [0003] For example, Patent Document 1 discloses a technique in which an adapter for separating the IC side power supply and the board side power supply is inserted between the IC and the board, and the positive test terminal on the adapter connected to the IC side power supply is connected to the board side power supply. An ammeter is connected between the negative test terminals on the connected adapter, thereby measuring the total amount of current consumed by the IC. [0004] prior art literature [0005] patent documents [0006] Patent Document 1: Japanese Unexamined Patent Publication No. 5-134002 [0007] Summary of the invention [0008] The problem to be solved by the invention [0009] However, in the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/26
CPCG01R31/021G01R31/2801G01R1/203G01R31/2886G01R31/2896G01R31/2889G01R1/067G01R1/073G01R31/26H01L22/00G01R31/58
Inventor 中山武司齐藤义行石井雅博石野公一石丸幸宏
Owner PANASONIC CORP