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Logic built-in self-test system

A built-in self-test and logic technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of long time spent by testers and long test cycle of the circuit under test, and achieve the effect of improving test efficiency

Active Publication Date: 2014-04-02
SUZHOU CENTEC COMM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the laboratory and the tester's R&D area are far apart, the tester often needs to spend a lot of time and energy going back and forth between the two, and accordingly, the test cycle for the circuit under test will become very long

Method used

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  • Logic built-in self-test system
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Embodiment Construction

[0021] Please refer to figure 1 As shown, the logic built-in self-test system of the present invention includes: a test vector generation system 1 (shown in a dashed box), a test machine 2 connected to the test vector generation system 1 and a fault detection system. The test vector generating system 1 includes a test software server 11, a central database 12, and an operation interface 13 (a computer in this embodiment) that can log in to the test software server 11. The testing machine 2 is used to connect with the circuit under test 3 and be placed together in a laboratory with specific conditions.

[0022] The central database 12 is used to collect and process metadata useful for generating logic BIST vectors. The logic built-in self-test system of the present invention is also provided with at least one input interface (not shown) connected to the central database 12 for inputting original data. These original data are entered and checked by the data source department. ...

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Abstract

The invention discloses a logic built-in self-test system. The system comprises a test vector generating system and a testing machine connected with the test vector generating system, wherein the testing machine is used for being connected together with a circuit to be tested; the test vector generating system comprises a test software server and an operation interface capable of accessing the test software server; test software can be started by operating the operation interface, so as to generate a logic built-in self-test vector; the test software server is connected with the testing machine through a network; and the generated logic built-in self-test vector is transplanted to the testing machine through the network. Therefore, spatial limitation is overcome, test resources are optimized, and the test efficiency is improved.

Description

technical field [0001] The invention relates to a logic built-in self-test system, which belongs to the field of integrated circuit board level production test. Background technique [0002] With the shrinking of the process size of integrated circuits and the continuous improvement of circuit complexity, especially the emergence and wide application of System-on-Chip (SoC), the integration of VLSI has been developed to a chip It can integrate more than tens of millions of transistors. Therefore, exploring and applying low-cost, high-efficiency testing techniques and testing systems has become an important topic in chip testing. [0003] The logic built-in self-test (Logic Built-In Self-Test, LBIST) method is to transfer some functions of the tester to the inside of the integrated circuit, and use the test circuit embedded in the integrated circuit to improve the input test vector and analyze the response function. Finally output a simple test structure. [0004] Although...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3185
Inventor 唐飞
Owner SUZHOU CENTEC COMM CO LTD