On-line test structure for polycrystalline silicon Poisson ratio
An on-line testing, polysilicon technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve problems such as not conforming to the process line, and achieve the effect of stable test parameter values, stable test process, and simple test methods
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0014] Below in conjunction with accompanying drawing and specific embodiment, further illustrate the present invention, should be understood that these embodiments are only for illustrating the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various aspects of the present invention Modifications in equivalent forms all fall within the scope defined by the appended claims of this application.
[0015] 1. Test structure
[0016] Such as Figure 1~4 As shown, the test structure of the present invention is composed of an insulating substrate 1 , an asymmetric polysilicon cross beam 2 , a first polysilicon lower plate 3 and a second polysilicon lower plate 4 . The polysilicon cross beam 2 is composed of five parts: the first anchor area 8 and the second anchor area 9 of the support structure, the first twist beam 6 , the second twist beam 7 and the horizontal beam...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com