Image processing-based magnetic particle inspection defect intelligent identification detection system

A technology of image processing and magnetic particle flaw detection, applied in the direction of material magnetic variables, etc., can solve problems such as complex detection algorithms, complexity of workpiece surface images, and weak signal characteristics

Inactive Publication Date: 2012-07-18
CHANGSHU RES INSTITUE OF NANJING UNIV OF SCI & TECH +1
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Problems solved by technology

[0009] However, the complexity of the surface image of the workpiece and the weak signal of the crack make this research have many difficult problems to solve:
The complexity of the image of the train wheel pair workpiece, the charac

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  • Image processing-based magnetic particle inspection defect intelligent identification detection system
  • Image processing-based magnetic particle inspection defect intelligent identification detection system
  • Image processing-based magnetic particle inspection defect intelligent identification detection system

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Embodiment Construction

[0028] The present invention is based on image processing magnetic particle flaw detection defect intelligent recognition detection system, comprises communication module 1, CCD camera 2, CCD control module 3, crack identification module 5, image processing module 6, image alarm terminal 7 and first memory card Memory8, the first memory card Two memory cards Memory9; one end of the communication module 1 is connected to the external turntable control system, and the other end is connected to the CCD camera 2. After starting up and running, after initializing and adjusting the parameters of the CCD camera 2, the surface image of the workpiece is collected by the CCD camera 2. The image data in the first memory card Memory8 is stored in the first memory card Memory8, and the image processing module 6 performs segmentation and defect recognition processing on the image in the first memory card Memory8, and the processing results are stored in the second memory card Memory9, and the...

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Abstract

The invention discloses an image processing-based magnetic particle inspection defect intelligent identification detection system. A communication module, a CCD (Charge Coupled Device) camera, a CCD control module, a crack identification module, an image processing module, an image alarm terminal and a memory are integrated in the system; a surface image of a workpiece is acquired by the CCD camera and is stored in a memory card; the image processing module is used for segmentation, defect identification processing and storage of the image in the memory card and transferring defect information of the surface of the workpiece to the crack identification module; and the defect information of the surface of the workpiece is fed back to the image alarm terminal by the crack identification module to finish the final display alarm. By improving a segmentation algorithm, the problems such as imaging fuzziness caused by motion, imaging region selection and false alarm caused by pseudo-crack signal existing in the system are solved excellently.

Description

technical field [0001] The invention relates to the field of non-destructive testing of magnetic particle flaw detection, in particular to an image processing-based intelligent identification and detection system of magnetic particle flaw detection defects. Background technique [0002] At present, the fully automatic magnetic particle flaw detection technology that uses a microcomputer intelligent system to replace human eyes to judge defects is in the research stage, and no mature system has been launched yet. [0003] The fluorescent magnetic particle automatic identification system developed by Beijing University of Technology has acquisition, smoothing, enhancement, and display modules, but no actual identification system has successfully run on the inspection production line. [0004] Some non-destructive testing manufacturers in China have launched trial products. The intelligent fluorescent magnetic particle flaw detector developed by the Second Department of the Sec...

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Application Information

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IPC IPC(8): G01N27/84
Inventor 施光莹李千目
Owner CHANGSHU RES INSTITUE OF NANJING UNIV OF SCI & TECH
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