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Method for rapidly creating integrated circuit test program package

A test program and integrated circuit technology, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of difficult test program debugging and low test development efficiency, so as to save interruption time, avoid manual intervention, and reduce workload Effect

Inactive Publication Date: 2012-07-25
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present in this patented technology allows for automatic extraction of signals called vcd simulations (VCA) that are created during development without manually entering any data like numbers on paper. This saves effort compared to previous methods while also improving efficiency when compiling and analyzing test results. Additionally, it uses a method where timings between different values within an experiment's simulated vector are extracted automatically based upon certain rules set forth earlier. These technical improvements make analysis faster and more accurate than previously possible.

Problems solved by technology

This technical problem addressed in this patented describes how to efficiently produce and verify test programming packages on ASIC devices without error caused by human factors. Current manual methods require significant effort and may result in imprecision and difficulty in generating these tests. Automation has been attempted but there remains challenges related to accurately delivering accurate data values while reducing costs associated with manpower efforts. Additionally, current automating tools like CFT® perform calculations based upon predetermined rules rather than optimizing their execution speed and performance.

Method used

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  • Method for rapidly creating integrated circuit test program package
  • Method for rapidly creating integrated circuit test program package
  • Method for rapidly creating integrated circuit test program package

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Embodiment Construction

[0015] see figure 1 , the present invention creates the step of the fast method of integrated circuit test program package and comprises the following four parts:

[0016] The first part is configuration file generation. Configuration file generation first extracts the signal name from the VCD simulation vector, creates a configuration file template, according to the pin number or coordinate number, input / output attribute in the DUT product manual (Specification), and the ATE hardware channel used in the design of the test interface board, Write in the template to form a configuration file, the format is in the form of a list, such as error! Reference source not found. shown. Finally, use the configuration file to generate the config file and the level file that the ATE test software can call directly.

[0017] The second part is the pruning of test timing. The test sequence pruning mainly uses four optional pruning methods to prune the VCD simulation vector according to ...

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Abstract

The invention discloses a method for rapidly creating an integrated circuit test program package, which comprises the following steps of: (1) a step of generating a configuration file; (2) a step of trimming test timing; (3) a step of converting a vector; and (4) a step of compiling a testing file. According to the invention, a signal name can be extracted from the VCD (Video Compact Disc) simulation vector; the error is avoided being introduced by manual input; by timing trimming before conversion, the workload of compiling and debugging is reduced; by adopting a batch conversion mode, the manual intervention is avoided and the interruption time of the conversion process is saved; timing information is extracted in a variable representation mode and the method can be directly used for down debugging or overclock testing of a DUT (Device Under Test).

Description

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Claims

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Application Information

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Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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