Circuit failure diagnosis method based on node information
A circuit fault and diagnosis method technology, which is applied in the direction of electronic circuit testing, etc., can solve problems such as the difficulty in locating faulty components, the inability to obtain a fault dictionary, and the inability to establish a simulation model, so as to facilitate circuit fault analysis and overcome the complexity of representation methods and representation The method is simple and intuitive
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0024] Embodiment selection of the present invention figure 2 The band-stop filter circuit shown is for fault diagnosis, assuming that resistor R4 in the circuit fails.
[0025] combined with figure 1 , the detection steps of the embodiment of the present invention are as follows:
[0026] Step 1. Right figure 2 The 20 test nodes of the band-stop filter circuit are numbered sequentially from 1 to 20, and all test nodes are separated by the smallest grid in the two directions of x and y, and the element values in the empty grid are filled with -1, such as image 3 As shown, the matrix formed by the grid is used as the position matrix P of the circuit test node, and the size of the position matrix is the size of the grid number, namely:
[0027] P = 1 2 3 5 6 ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com