Circuit failure diagnosis method based on node information

A circuit fault and diagnosis method technology, which is applied in the direction of electronic circuit testing, etc., can solve problems such as the difficulty in locating faulty components, the inability to obtain a fault dictionary, and the inability to establish a simulation model, so as to facilitate circuit fault analysis and overcome the complexity of representation methods and representation The method is simple and intuitive

Inactive Publication Date: 2012-07-25
XIDIAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, for circuits with insufficient prior knowledge and incomplete technical data, it is impossible to establish a simula

Method used

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  • Circuit failure diagnosis method based on node information
  • Circuit failure diagnosis method based on node information
  • Circuit failure diagnosis method based on node information

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Embodiment Construction

[0024] Embodiment selection of the present invention figure 2 The band-stop filter circuit shown is for fault diagnosis, assuming that resistor R4 in the circuit fails.

[0025] combined with figure 1 , the detection steps of the embodiment of the present invention are as follows:

[0026] Step 1. Right figure 2 The 20 test nodes of the band-stop filter circuit are numbered sequentially from 1 to 20, and all test nodes are separated by the smallest grid in the two directions of x and y, and the element values ​​in the empty grid are filled with -1, such as image 3 As shown, the matrix formed by the grid is used as the position matrix P of the circuit test node, and the size of the position matrix is ​​the size of the grid number, namely:

[0027] P = 1 2 3 5 6 ...

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Abstract

The invention discloses a circuit failure diagnosis method based on node information, which is mainly used for solving the defect that the traditional failure diagnosis method must know the known circuit schematic diagram. During diagnosis, beyond factors of the electric characteristics, the connecting relationships and the circuit structures of specific components of a circuit, with information of a circuit testing node as the basis of circuit failure diagnosis, failure diagnosis can be effectively carried out without establishing a failure dictionary, signal characteristics of circuit nodes are represented by using matrix digital forms; position distribution information, energy distribution information and correlation information of the circuit nodes are respectively presented by establishing a position matrix, an energy matrix and a correlation matrix; then state change characteristics and information transfer characteristics of the energy change matrix and the correlation change matrix are figured out; and failure nodes in state change nodes are searched through node information transfer characteristics, therefore positions of failure elements are located. The circuit failure diagnosis method has the advantages of simple method of representing the circuit node characteristics and convenience for failure analysis.

Description

technical field [0001] The invention belongs to the technical field of testing and relates to the field of circuit fault diagnosis, in particular to a circuit fault diagnosis method based on node information, which can be used for circuit fault diagnosis with unknown schematic diagram and unknown chip technical data. Background technique [0002] Fault diagnosis is a method of analyzing and processing the useful information obtained from the test of the diagnosed object, judging whether the diagnosed object is in an abnormal state or a fault state, determining the location of the fault, and predicting the occurrence of the fault. Fault diagnosis consists of four parts: system modeling and fault modeling, fault detection, fault separation or identification, and fault prediction. Different fault diagnosis methods are formed according to the differences in the characteristic description and detection methods adopted by the system. International fault diagnosis authority Profes...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 李小平谢楷方海燕刘彦明黎剑兵陶稳苏敏
Owner XIDIAN UNIV
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