Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Metrological verification device for automatic test system

An automatic test system and metrological verification technology, which is applied in the direction of instruments, etc., can solve the problems of large damage to equipment, low efficiency, and inaccurate metrological verification results, and achieve the effect of reducing damage, reducing influence, and improving verification work efficiency

Inactive Publication Date: 2012-08-01
NAVAL AERONAUTICAL & ASTRONAUTICAL UNIV PLA
View PDF4 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method not only has great damage to the equipment and low efficiency, but also due to the influence of the system environment, the technical index of a single instrument cannot represent the whole system. Therefore, the metrological verification results obtained by this method are not accurate.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Metrological verification device for automatic test system
  • Metrological verification device for automatic test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] The present invention will be described in further detail below with reference to the drawings and examples, but the embodiments of the present invention are not limited thereto.

[0015] like figure 1 As shown, the measurement verification device includes a control computer, a standard instrument, and a verification adapter. The standard instrument is connected to the verification adapter through a cable, and the standard instrument is connected to the control computer through a GPIB control bus.

[0016] The control computer adopts the control computer of the automatic test system. Install GPIB controller, VXI controller, and measurement verification program on the control computer.

[0017] Metrology verification program includes database and test program. The database is managed by MicroSoft Office Access, including: standard instrument information table, automatic test system resource information table, metrological verification test information table, verificati...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a metrological verification device capable of realizing in-situ integral metrological verification for an automatic test system based on a GPIB (general purpose interface bus) and VXI (virtual extension interface) mixed bus, which comprises a control computer, a standard instrument and a verification adapter, wherein the standard instrument is connected with the verification adapter through a cable and is connected with the control computer through a GPIB control bus, a GPIB controller, a VXI-MXI (multisystem extension interface) controller and a metrological verification program are installed in the control computer of the automatic test system, and the verification adapter is connected with an ARINC608A interface of the automatic test system. When metrological verification is performed, measurement data are obtained from the ARINC608A interface of the automatic test system, in-situ metrological verification of the automatic test system is realized, damage to instruments and equipment is reduced, integral verification of comprehensive technical indexes of the ATS (automatic test system) is realized, and verification efficiency is improved.

Description

technical field [0001] The invention relates to the metrological verification of an automatic test system, in particular to a metrological verification of an automatic test system based on a GPIB and VXI hybrid bus. Background technique [0002] With the development of automatic test technology, more and more application integrated and automated automatic test systems (Automatic Test System, ATS for short) are tested. ATS is controlled by a control computer through GPIB, VXI and other buses. It has the characteristics of many types of instruments and equipment, wide distribution of parameters, complex interface technology, and many sources that affect the measurement results. At present, my country has not promulgated corresponding metrological verification regulations for the metrological verification of ATS. In actual work, the method of off-site measurement is generally used, that is, a single instrument is removed and sent to the laboratory for metrological verification....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01D18/00
Inventor 史贤俊程继红李涛张华锋周国洲秦亮唐静
Owner NAVAL AERONAUTICAL & ASTRONAUTICAL UNIV PLA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com