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Large plain film spectrum tester

A large flat film and tester technology, applied in the field of spectroscopic instruments, can solve the problems of unsuitable test spot requirements and large test spots, and achieve the effects of reducing test spots, ensuring test accuracy and accuracy, and ensuring positioning

Active Publication Date: 2012-08-01
上海欣茂仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] At the same time, the current traditional test instruments have large test spots during the test process, which is not suitable for the requirements of more and more scientific and technological fields for test spots.

Method used

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Embodiment Construction

[0019] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0020] as attached figure 1 , 2 As shown in and 3, a large flat sheet spectrum tester includes a housing 1 made of engineering plastics, a base plate 2 made of 2.0mm sheet metal material, a light source lamp chamber 3, a monochromator 4, an outgoing light slit assembly 5, an incident light Optical slit assembly 6, sample chamber 7, detection device 8, test platform 9, buttons 10, display 11, instrument panel 12 and communication interface 13, the light source lamp chamber 3 is installed in the base plate 2, and the light source lamp chamber on the base plate 2 The monochromator 4 is installed below the 3, the exit light slit assembly 5 and the incident light slit assembly 6 are respectively installed on the two adjacent sides of the base of the monochromator 4 which are 90° perpendicular to each other, and the sample chamber 7 is installed on the botto...

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Abstract

The invention discloses a large plain film spectrum tester, which comprises a shell (1), a bottom plate (2), a light source lamp chamber (3), a monochromator (4), an emergent light slit assembly (5), an incident light slit assembly (6), a sample chamber (7), a detection device (8), a test platform (9), a key (10), a display (11), an instrument panel (12) and a communication interface (13), and is characterized in that: the emergent light slit assembly (5) and the incident light slit assembly (6) are provided with four groups of slits; and spectrum bandwidths are 3 nanometers, 5 nanometers, 6.6 nanometers and 10 nanometers respectively in sequence. The optical path transmission direction in the conventional large plain film spectrum tester is changed, so that a test light spot is reduced, small light through hole test of a large-sized sample to be tested is realized, the sample to be tested can be directly put onto a workbench for testing, test accuracy and test accuracy are ensured, operation is simple and convenient, a test sample can be prevented from being damaged, and cost is saved.

Description

technical field [0001] The invention relates to the field of spectrometers used for material composition analysis, in particular to a large flat sheet spectrometer capable of vertically testing small apertures of large samples. Background technique [0002] The basic working principle of the large flat sheet spectrometer is that the substances in the solution produce an absorption effect on light under the excitation of light irradiation. The absorption of light by substances is selective, and various substances have their own Absorption spectrum, so when a certain monochromatic light passes through the solution, its energy will be absorbed and weakened. The degree of light energy weakening has a certain proportional relationship with the concentration of the substance. The comparison of the light intensity between the sample and the standard sample is analyzed to analyze the composition of the substance. [0003] Large flat sheet spectrometers are widely used in various fi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31
Inventor 冯迈东
Owner 上海欣茂仪器有限公司
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