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Method of in-situ assembly, electrochemical reduction and representation of graphene oxide

An electrochemical and graphene technology, applied in the field of analytical chemistry, can solve problems such as difficulty in meeting detection requirements, low detection accuracy, and inability to detect the degree of GO reduction in situ, achieving good application prospects and simple detection methods.

Inactive Publication Date: 2013-11-27
JILIN UNIV
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Problems solved by technology

[0005] The main problems of the existing detection technology are: (1) Raman spectroscopy cannot quantitatively detect the reduction degree of GO, and the XPS detection results have large errors, and the above two methods cannot detect the reduction degree of GO in situ
(2) In-situ assembly, electrochemical reduction, and characterization of graphene oxide need to be completed on different equipment, resulting in samples being easily contaminated, low detection accuracy, and cumbersome operations
However, due to factors such as testing equipment and sample contamination, it is impossible to detect the assembly and reduction of GO in situ sequentially, and the results have large errors, which are difficult to meet the detection requirements of scientific research and practical applications.

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  • Method of in-situ assembly, electrochemical reduction and representation of graphene oxide

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Embodiment Construction

[0027] Graphene oxide prepared by the improved Hummers method was dissolved in water, and a well-dispersed graphene oxide solution was obtained by ultrasonic exfoliation. The concentration of graphene oxide solution was (0.01, 2, 10) mg / ml; GO was dropped on mica On-chip, transmission electron microscopy (TEM) and atomic force microscopy (AFM) characterizations are performed, see Figure 1.

[0028] Real-time monitoring of the GO assembly process on the gold film surface of the sensor chip. Assemble and test the SPR curve of the gold film in the air, add deionized water, pass 2mg / mL GO aqueous solution into the sample cell, assemble (1, 12, 16) h, and then rinse off the unassembled GO solution with deionized water, SPR kinetic curves during assembly refer to figure 2 . Then use high-purity nitrogen to dry the surface of the gold film of the sensor chip, and test the SPR curve of the gold film surface of the sensor chip after assembling GO.

[0029] Pass the PBS (pH=7.4) solu...

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Abstract

The invention relates to a method of in-situ assembly, electrochemical reduction and oxidation state conversion representation of graphene oxide, belonging to the technical field of nano materials. According to the method, a surface plasmon resonance technology is used to in situ monitoring the assembly process of chemically prepared graphene oxide on the surface of a gold film and in situ quantitatively detecting different reduction degrees of graphene oxide. The method comprises the following steps: assembling graphene oxide on the surface of the gold film through physical absorption; in situ reducing graphene oxide into graphene by using an electrochemical method; and fitting a curve of a surface plasmon spectrum by using software to detect the assembly and reduction degrees of graphene oxide on the surface of a sensor chip. The method has the advantages that the assembly, electrochemical reduction and detection of graphene oxide are implemented on one set of machine, instruments and equipment are low in price and simple to operate, and the efficiency and the accuracy are high.

Description

technical field [0001] The invention belongs to the field of analytical chemistry, and in particular relates to a surface plasmon resonance (Surface Plasmon Resonance, SPR) technology for the assembly and reduction degree detection of graphene oxide (Graphene Oxide, GO). Background technique [0002] Graphene is a new type of material discovered in 2004 and developed rapidly. It is widely used in medicine, biology, chemistry, electronics, physics and other fields. Graphene prepared by chemical method is the reduction of GO to graphene (RGO). At present, the methods used to detect whether GO is reduced are mainly Raman spectroscopy (Raman spectrum), X-ray photoelectron spectroscopy (XPS) and atomic force microscopy. However, there are large errors in the above characterization methods, and the detection of the assembly process of graphene oxide and the reduction degree of graphene oxide cannot be accurately quantified and in-situ characterized. Therefore, a new method is nee...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/55
Inventor 崔小强郑伟涛薛天宇
Owner JILIN UNIV
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