Model construction and evaluation method for service life and reliability of product under outfield circumstance

A reliability and product technology, applied in the field of life and reliability evaluation, can solve problems such as difficult evaluation work and scarce field information

CN102663516AInactive Publication Date: 2012-09-12BEIHANG UNIV
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
Publication Date
2012-09-12
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a model construction and evaluation method for service life and reliability of a product under the outfield circumstance. Specifically, the method comprises the following steps: step one, establishing and determining a degradation model of a product; step two, constructing a correction factor; step three, establishing a bayesian model; step four, obtaining a parameter value of posterior distribution; and step five, evaluating service life and reliability. According to the invention, a relation between laboratory information and outfield information is established and differences among all stress environments are determined and quantized, thereby providing a powerful basis for future work on evaluation and result correction; besides, a method in which two kinds of information, that is the laboratory information and the outfield information, is comprehensively utilized to evaluate service life and reliability of the product under the outfield circumstance is brought forward, so that problems that there is certain deviation due to direct evaluation with utilization of accelerated degradation testing information and it is difficult to do evaluation work due to sparse outfield information can be solved.
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Description

technical field

[0001] The invention is a method for evaluating the service life and reliability of a product in an external field by comprehensively using accelerated degradation test data and product field data, and belongs to the technical field of life and reliability evaluation. Background technique

[0002] Product life and reliability information can be reflected by its failure data and degradation data, which can be used to evaluate the product life distribution model. However, in the actual use of the product in the field, it is difficult to obtain enough information for evaluation in a short period of time. At this time, the accelerated test technology emerges as the times require. For the traditional accelerated life test in the accelerated test, it is difficult to obtain sufficient failure data under the condition of limited time and funds when evaluating long-life and high-reliability products. At this time, the accelerated degradation test method should be use...

Examples

Embodiment

[0112] If a temperature step stress accelerated degradation test is carried out on a photoelectric product, the sample size is 4, the temperature stress level is 4, the temperature is 60°C, 80°C, 100°C, 120°C; the test time for each stress level is 1250 , 750, 500, 500 hours; the product performance testing time interval Δt is 5 hours. At the same time, a product is used in the field at a temperature of 25°C, and its data has been collected for 5,000 hours. The product's performance testing time interval Δt is 5 hours. Select optical power as its performance parameter, the initial value of optical power y 0 is 100, and the parameter failure threshold l is 40. It is necessary to evaluate the reliability of the product under field conditions for 3 years and the life of the product when the reliability is 0.95.

[0113] Step 1. Establish and determine relevant models

[0114] Since the stress applied to the product is temperature, the Arrhenius model is selected as the acceler...