Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Defect region extraction method

A region extraction and defect technology, applied in image data processing, instruments, calculations, etc., can solve the problems of slow extraction method and unsuitable real-time detection, and achieve the effect of fast speed and improved detection speed

Inactive Publication Date: 2012-09-26
HENAN UNIV OF SCI & TECH
View PDF4 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a defect area extraction method to solve the problem that the existing extraction method is slow and unsuitable for real-time detection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Defect region extraction method
  • Defect region extraction method
  • Defect region extraction method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Defect region extraction methods such as figure 1 , 2 As shown, the specific steps are as follows:

[0014] (1) Scan the image column by column;

[0015] (2) If the image gray value difference of a point is found to be greater than the preset threshold during the scanning process, the point is a suspected defect point;

[0016] (3) Expand along the scanning direction, execute the boundary local search algorithm from the upper and lower directions respectively, and find out the upper and lower defect boundaries A1 and A2;

[0017] (4) Until the boundary points collected from the upper and lower boundaries coincide, extract the defect area.

[0018] The boundary local search algorithm in step (3) is a prior art, and can be found in "Boundary Local Search Algorithm and Application" published by Wu Guifang et al. in February 2005 in "Computer Applications", Volume 25, Issue 2.

[0019] figure 2 Among them, 1 indicates that the sequential scanning direction is colu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a defect region extraction method which comprises the following steps: firstly, carrying out line or row gradual scanning on an image; in the process of scanning, if finding that the image grey-level difference of a point is greater than a preset threshold value, determining that the point is a suspicious defect point; carrying out expanding along the scanning direction, and respectively executing a boundary local-search algorithm from the up-and-down direction or the left-and-right direction so as to find out two defect boundaries in the up-and-down direction and the left-and-right direction; and until the boundary points acquired from the up-and-down or left-and-right boundary are coincided, extracting a defect region. According to the method, in the process of extracting a defect, an image is only subjected to scanning operation for one time, and after a first point of the defect is detected, the scanning process is simpler, and detection can be performed automatically tightly along the defect region until the defect region is completely extracted; and the detecting method is rapid in speed, and applicable to the defect region extraction with high requirements on rapid edge-region positioning and instantaneity.

Description

technical field [0001] The invention belongs to the technical field of surface defect quality detection, and relates to a defect area extraction method. Background technique [0002] At present, in terms of surface defect quality inspection technology, the image is generally processed, the defect area is extracted first, and then feature extraction is performed on the defect area to identify and classify the defect. For the defect area extraction in the first stage, the traditional defect area extraction method is mainly to perform various filters on the image, and then binarize the filtered image to obtain the defect area. For example, the X-ray image defect extraction method based on sub-area adaptive median filter is to perform one-dimensional median filter based on scan line in different directions according to the gray level change characteristics in different regions of the image, and make the length of the filter can be adjusted along with the defect. The size is aut...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
Inventor 吴贵芳
Owner HENAN UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com