A kind of OLT test method and device

Abstract

The invention provides an OLT testing method and a device. The method comprises the steps that a downlink GTC layer receives GEM message sent by a GEM layer and packages the GEM message into GTC frame data according to a preset GTC frame head form, and the downlink GTC layer sends the GTC frame data to an uplink GTC layer, so as to ensure that the uplink GTC layer analyzes the GTC frame data according to the preset GTC frame head form, and sends GEM message obtained after analysis to the GEM layer. The method is developed in terms of matching of uplink frame structural form and the downlink frame structural form and matching of uplink data rate and downlink data rate, realizes the loopback test process of OTL, and further realizes the purpose of testing whether an OLT function is normal.

Description

technical field [0001] The invention relates to the field of communication technology, in particular to a method and device for OLT testing. Background technique [0002] The existing GPON (Gigabit-Capable PON, gigabit passive optical network, where PON is the abbreviation of Passive Optical Network) system mainly includes the OLT (optical line terminal, optical line terminal) at the central office and the ONU (Optical Network Unit) at the user end. , optical network unit), the ratio of the number of OLT to ONU is 1:N, the OLT can distribute the downlink data to N ONUs through the optical splitter, and the N ONUs can aggregate the uplink data to the OLT through the optical splitter. [0003] In order to ensure that the OLT can communicate normally with multiple ONUs, it is necessary to test the OLT function during the production test stage and the engineering test stage. However, because the format of the upstream frame structure of the GPON system is different from that of ...

AI Technical Summary

Problems solved by technology

[0005] Although the above-mentioned test process can complete the OLT function detection, because the number of service channels inside the chip is far greater than the number of service channels inside a single ONU, it is necessary to arrange a large number of ONUs for testing at the user end, which causes ONU resources. Great waste, increased testing costs

In addition, when judging whether the service channel is normal, the chip needs to wait for the data to be looped back from the test ONU at the user end to the local end, which makes the test efficiency very low on the one hand, and on the other hand, this test method can only determine the Whether the multiple service channels of the ONU are normal, but cannot quickly determine the specific service channel that has failed

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