Triaxial MEMS gyroscope rotation integral calibration method based on uniaxial turntable

A single-axis turntable and calibration method technology, which is applied in the field of MEMS gyroscopes, can solve the problems of low precision, time-consuming and fast calibration methods, etc.

Active Publication Date: 2013-01-02
EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a three-axis MEMS gyro integral calibration method based on a single-axis turntable, which

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  • Triaxial MEMS gyroscope rotation integral calibration method based on uniaxial turntable
  • Triaxial MEMS gyroscope rotation integral calibration method based on uniaxial turntable
  • Triaxial MEMS gyroscope rotation integral calibration method based on uniaxial turntable

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Embodiment Construction

[0033] The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.

[0034] Technical solution of the present invention: the three-axis MEMS gyroscope is fixed on the single-axis turntable, such as figure 1 , first let the input sensitive axis of the Z-axis gyro point to the sky (+Z direction), the position function of the turntable controls the turntable to turn counterclockwise 360°, record data, then let the turntable turn clockwise 360°, record data; then the Z-axis The input sensitive axis of the gyro points to the ground (-Z direction), test and record the data in the same way. Then, place the gyroscope in ±X and ±Y directions respectively, repeat the above steps and methods, and record the data.

[0035] Through the 12 rotations of the above 6 positions,...

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Abstract

The invention discloses a triaxial MEMS gyroscope rotation integral calibration method based on a uniaxial turntable. According to the invention, first, a triaxial MEMS gyroscope error model is established; the triaxial MEMS gyroscope is fixed on the uniaxial turntable; MEMS gyroscope six-position rotary calibration is carried out; test data and sampling time of 12 times of rotation of the MEMS gyroscope at the 6 positions are tested and recorded; through the 12 times of rotation of the MEMS gyroscope at the 6 positions, a MEMS gyroscope error model is simplified, and an error model after gyroscope rotation is obtained; integral calculations are carried out upon two sides of the equation of the error model after gyroscope rotation, an error equation set is established, and MEMS gyroscope error coefficient is obtained by calculation. With the method provided by the invention, calibration precision is ensured; and fixed zero bias, scale factor, cross-coupling error coefficient, and acceleration sensitivity coefficient of the MEMS gyroscope can be solved rapidly, such that calibration efficiency is improved.

Description

technical field [0001] The invention relates to a three-axis MEMS (Micro-Electro-Mechanical Systems, Micro-Electro-Mechanical Systems) gyroscope calibration method, which belongs to the technical field of MEMS gyroscopes. Background technique [0002] Traditional gyroscope calibration methods include: static multi-position method and angular rate method. The deterministic error coefficient of the gyroscope can be calibrated by position test and angular rate test. The method and steps are relatively complicated, and each error item has different calibration methods and steps, and the calibration of some error items requires a long data collection time; although the calibration accuracy of this method is very high, the calibration time is very long. [0003] Aiming at the problem that the traditional calibration method takes too long, some researchers have invented a fast on-site calibration method based on fiber optic gyroscope without a turntable. The method does not use a ...

Claims

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Application Information

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IPC IPC(8): G01C25/00
Inventor 董冀周芳王晓臣鞠莉娜
Owner EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
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