Error proofing device of test socket for semiconductor devices

Abstract

The invention relates to the technical field of semiconductor devices, particularly relates to the field of tests for semiconductor devices, and discloses an error proofing device of a test socket for semiconductor devices. The error proofing device comprises a test box and a plurality of manual test lines. A connector is formed at one end of each manual test line so as to be in butt joint with a corresponding connector on the test box in a matched manner; the other ends of the manual test lines are gathered on a manual test socket, and a semiconductor device can be plugged in the manual test socket to be tested; a four-port female plug is connected into the middle of one of the manual test lines, two connection terminals of the female plug are respectively connected with two cut ends of the manual test line, and another group of connection terminals of the female plug is disconnected with the manual test line; and two connection terminals of a four-port male plug matched with the female plug disconnect start signal lines of a manipulator, and another group of connection terminals of the male plug are in short circuit. Running signals of the manipulator are related to the manual test socket, the manipulator cannot continue running if the manual test socket is plugged, and accordingly an error proofing effect is achieved. The error proofing device is simple in structure and easy to manufacture and implement.

Description

Technical field: [0001] The present invention relates to the technical field of semiconductor devices, in particular to the field of semiconductor device testing. Background technique: [0002] In the prior art, semiconductor devices generally insert pins into the hand test socket of the hand test line, and connect the test box through the hand test line for testing. However, it often happens that the hand test socket is used and the test socket is forgotten to be unplugged, so that the test is The components on the socket cause all the tested products to be the result of the product plugged into the socket, which leads to abnormal test results. Summary of the invention: [0003] The object of the present invention is to provide an error-proofing device for semiconductor device test sockets that associates the manipulator operation signal with the hand-test socket. If the hand-test socket is not pulled out, the manipulator cannot run continuously to achieve the error-proof effect....

AI Technical Summary

Problems solved by technology

[0002] In the prior art, the pins of semiconductor devices are generally inserted into the manual test socket of the manual test line, and the test box is connected to the test box through the manual test line for testing. The components on the socket lead to all the tested products being the result of products plugged into the manual test socket, which leads to abnormal test results

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