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A Multi-Region Image Inspection Method Traversing Grain Irregular Regions

An image detection and multi-region technology, applied in the direction of measuring devices, individual particle analysis, particle and settlement analysis, etc., can solve problems such as low efficiency and unpredictable traversal paths, so as to improve efficiency, avoid empty step conditions, Effect of preventing detachment from the grain area

Inactive Publication Date: 2016-04-27
THE 45TH RES INST OF CETC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a multi-region image detection method for traversing grain irregular regions, aiming to solve the problem that the existing method for traversing grains can only detect a single grain at a time, and the efficiency is low. And it is impossible to predict whether the traversal path is reasonable, so as to improve the speed of the single grain traversal process and improve the integrity of the entire area traversal

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  • A Multi-Region Image Inspection Method Traversing Grain Irregular Regions

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Embodiment Construction

[0024] The substantive features and advantages of the present invention will be further described below in conjunction with examples, but the present invention is not limited to the listed embodiments.

[0025] Based on the image processing technology, the present invention obtains grain images by taking pictures of image acquisition equipment, judges the existence and position of grains in multiple regions in the image, and drives the motor of the grain carrying workbench according to the presence and position of the grains operation to realize the stepping action of the grain carrying workbench, and finally complete the traversal of the grains in the irregular area.

[0026] The present invention is achieved in this way, a multi-region image detection method for traversing irregular regions of crystal grains, comprising the following steps:

[0027] Step 1, the computer is controlled by an image input device that collects the grains on the grain bearing workbench through the...

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Abstract

The invention discloses a multi-region image detection method for traversing irregular regions of crystalline grains. The method comprises the following steps of shooting a crystalline grain image through using image collecting equipment and transmitting the crystalline grain image to an equipment control computer of a crystal fixing machine; carrying out analysis treatment on the image in the equipment control computer; judging whether the crystalline grains in a plurality of regions in the image have conditions or not; driving a worktable motor to operate according to whether the crystalline grains have conditions or not to realize the stepping movement of a worktable; and finally, traversing the crystalline grains in the irregular regions. According to the method disclosed by the invention, under the condition that a motor speed and an image processing efficiency are unchanged, the traversing efficiency of the crystalline grains is improved and a meaningless empty stepping condition of the worktable is effectively avoided; and in the whole crystalline grain region traversing process, a traversing jumping movement of the worktable is guided through the judgment of a plurality of the regions, so that the worktable is prevented from being released from the region of the crystalline grains and the integrity of traversing the region of the crystalline grains for single time can be improved.

Description

technical field [0001] The present invention relates to the technical field of crystal grain traversal methods for die bonding machines, in particular to a multi-region image detection method for traversing irregular regions of crystal grains Background technique [0002] With the development of my country's semiconductor lighting industry, domestic semiconductor packaging manufacturers and equipment manufacturers have increased rapidly, and the crystal bonding machine that occupies the first process in semiconductor packaging equipment has developed rapidly. The pellets are picked up by the robot and fixed on the support. Therefore, it is one of the core technologies of the die bonder to quickly, accurately and completely traverse the die. [0003] The current grain traversal method is mainly to traverse a single grain in sequence, that is, the workbench steps once, the camera takes an image, and the image processing algorithm only checks the presence or absence of a grain ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/14G01V8/10
Inventor 周庆亚高建利侯为萍孟宪俊周冉
Owner THE 45TH RES INST OF CETC