Simulation testing system of electronic flight instrument system

Abstract

The invention discloses a simulation testing system of an electronic flight instrument system. The simulation testing system of the electronic flight instrument system comprises a main simulation unit and the like, wherein the main simulation unit, a bus simulation unit, a bus monitoring unit, a signal measurement and control unit, a video control unit, a switchboard unit and an adapter unit are connected with a main power source unit. The main simulation unit, the bus simulation unit, the bus monitoring unit and the signal measurement and control unit are connected with the switchboard unit. The bus simulation unit, the bus monitoring unit, the signal measurement and control unit, the signal measurement and the video control unit are connected with the adapter unit, and the adapter unit is connected with a product grounding unit. By the establishment of a universalized and totalized testing system, waste of manpower and material resources due to repeated construction of the testing system can be effectively solved, and at the same time, utilization efficiency of the testing system is improved, and scientific research is saved.

Description

technical field [0001] The invention relates to the field of avionics simulation test, in particular to an electronic flight instrument system simulation test system. Background technique [0002] Since its birth in the 10s of the 20th century, it has gone through the tests of World War I, World War II, the Korean War, the Vietnam War, and the Gulf War. awareness and understanding are also deepening. As the gathering point of all information on the aircraft, the cockpit plays an extremely important role in the entire flight or combat (fighter) process of the aircraft. [0003] A large amount of external information (such as navigation commands, threat location, incoming warning, etc.) and internal information (such as engine speed, fuel load, and working status of various systems) in the cockpit will be too much for people to see. It is undoubtedly a arduous task to screen, classify, and select the most important and urgently needed information to the driver from a large a...

AI Technical Summary

Problems solved by technology

[0006] The existing models of EFIS test equipment we have learned are all dedicated to special machines, that is, different EFIS test systems are established for different models, resulting in repeated design and processing of each test platform, resulting in low equipment utilization efficiency and large waste of resources, etc. The problem is that the wiring of a single test system is complicated, there are many test points, and the system maintenance is difficult

[0007] The patent situation in the field of EFIS testing we know is as follows: the patent with the patent number "03118894.X" and the patent name "Electronic Flight Instrument System Tester" proposes a technical solution for the electronic flight instrument system tester. Relatively simple, not universal, no video processing unit and bus data acquisition unit, etc., can no longer meet the testing requirements of EFIS

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