Methods for reducing path loss while testing wireless electronic devices with multiple antennas

Abstract

A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio- frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.

Description

Background technique [0001] The present application relates generally to testing electronic devices, and more particularly, to testing electronic devices that include multiple antennas. [0002] Electronic devices often contain wireless communication circuitry. For example, a device can use 2.4GHz and 5.0GHz (IEEE 802.11) frequency band for communication. Wireless communication is also possible in cellular telephone telecommunications bands and other radio frequency bands. In schemes such as antenna diversity schemes, electronic devices may use arrays with multiple antennas to handle wireless communications. [0003] When multiple antenna wireless devices of this type are manufactured in high volumes, an RF test station can be used to evaluate the performance of the wireless communication circuitry on each device to ensure that each device meets design guidelines. An RF test station typically includes a test mainframe, a tester (eg, a signal generator), and an electromagn...

AI Technical Summary

Problems solved by technology

If, in this fixed position, the first antenna is placed closer to the test antenna, the measurement results may be biased towards the first antenna (i.e. the test results may be more correct for the first antenna, but less correct for the second antenna)

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