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Joint test action group (JTAG) test link and diasonograph thereof

A technology for testing links and testing interfaces, which is applied in the direction of instruments, measuring electronics, measuring devices, etc. It can solve problems such as damage to devices and JTAG interface circuits, and achieve the effect of avoiding high potential or low potential and facilitating operation

Active Publication Date: 2015-07-15
SHENZHEN MINDRAY BIO MEDICAL ELECTRONICS CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Connect the JTAG signal of the local board and the JTAG signal of the whole system directly. In this case, there can only be one driving source. cables, there is a risk of damage to both the device and the JTAG interface circuitry

Method used

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  • Joint test action group (JTAG) test link and diasonograph thereof
  • Joint test action group (JTAG) test link and diasonograph thereof
  • Joint test action group (JTAG) test link and diasonograph thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] like figure 2 Shown is the JTAG test link of the first embodiment. The test link 100 is used to provide a test signal to the device under test 200 and receive a feedback output signal. The provided test signal may be a local board test signal or a whole machine test signal. TMS_DEVICE, TCK_DEVICE and TDI_DEVICE in the device under test 200 respectively represent the mode selection signal, clock signal and test data input signal input to the device under test 200. These signals can come from the local board test interface or the whole machine test interface. The output signal fed back by the device under test 200 can be output to a local board test interface or a complete machine test interface. By inputting the test signal and checking the output signal of the feedback, the device under test can be tested and functionally debugged.

[0022] The test link structure 100 of this embodiment includes a local board test interface 110 , a complete machine test interface 120...

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PUM

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Abstract

The invention discloses a joint test action group (JTAG) test link. The JTAG test link comprises a partial board card test interface and a complete machine test interface, and is characterized by further comprising a multipath input selection switch and a multipath output selection switch, wherein a signal input interface in the partial board card test interface is connected to a high potential end in the multipath input selection switch; a signal output interface in the partial board card test interface is connected to a high potential end in the multipath output selection switch; a signal input interface in the complete machine test interface is connected to a low potential end in the multipath input selection switch; a signal output interface of the complete machine test interface is connected to a low potential end in the multipath output selection switch; and the multipath input selection switch and the multipath output selection switch simultaneously choose the high potential ends or simultaneously choose the low potential ends. According to the JTAG test link, partial board card test signals and complete machine test signals can be protected from being switched in at the same time.

Description

【Technical field】 [0001] The invention relates to JTAG (Joint Test Action Group, joint test action organization) test, in particular to a JTAG test link and an ultrasonic diagnostic instrument thereof. 【Background technique】 [0002] In each stage of product development, if the device can be tested and functionally debugged through the JTAG port conveniently, the development efficiency and development quality will be greatly improved. Therefore, in the ultrasonic diagnostic instrument, in addition to the connector connecting the JTAG cable on the board, the JTAG link of the whole system is also connected to the board through the backplane connector, so that whether it is a local board In the debugging stage, or after the board is loaded into the complete machine chassis of the ultrasonic diagnostic instrument (the interface of the JTAG link of the whole machine will lead out of the chassis), the JTAG tool can be conveniently used. [0003] The local board JTAG link and the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3185
Inventor 程东彪陈筱勇李鑫
Owner SHENZHEN MINDRAY BIO MEDICAL ELECTRONICS CO LTD
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