Joint test action group (JTAG) test link and diasonograph thereof

A technology for testing links and testing interfaces, which is applied in the direction of instruments, measuring electronics, measuring devices, etc. It can solve problems such as damage to devices and JTAG interface circuits, and achieve the effect of avoiding high potential or low potential and facilitating operation
CN103091626BActive Publication Date: 2015-07-15SHENZHEN MINDRAY BIO MEDICAL ELECTRONICS CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SHENZHEN MINDRAY BIO MEDICAL ELECTRONICS CO LTD
Publication Date
2015-07-15

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Abstract

The invention discloses a joint test action group (JTAG) test link. The JTAG test link comprises a partial board card test interface and a complete machine test interface, and is characterized by further comprising a multipath input selection switch and a multipath output selection switch, wherein a signal input interface in the partial board card test interface is connected to a high potential end in the multipath input selection switch; a signal output interface in the partial board card test interface is connected to a high potential end in the multipath output selection switch; a signal input interface in the complete machine test interface is connected to a low potential end in the multipath input selection switch; a signal output interface of the complete machine test interface is connected to a low potential end in the multipath output selection switch; and the multipath input selection switch and the multipath output selection switch simultaneously choose the high potential ends or simultaneously choose the low potential ends. According to the JTAG test link, partial board card test signals and complete machine test signals can be protected from being switched in at the same time.
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Description

【Technical field】

[0001] The invention relates to JTAG (Joint Test Action Group, joint test action organization) test, in particular to a JTAG test link and an ultrasonic diagnostic instrument thereof. 【Background technique】

[0002] In each stage of product development, if the device can be tested and functionally debugged through the JTAG port conveniently, the development efficiency and development quality will be greatly improved. Therefore, in the ultrasonic diagnostic instrument, in addition to the connector connecting the JTAG cable on the board, the JTAG link of the whole system is also connected to the board through the backplane connector, so that whether it is a local board In the debugging stage, or after the board is loaded into the complete machine chassis of the ultrasonic diagnostic instrument (the interface of the JTAG link of the whole machine will lead out of the chassis), the JTAG tool can be conveniently used.

[0003] The local board JTAG link and the ...

Claims

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